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Electric Field Direct Force in Electromigration Mechanism

  • A.A. Karpushin (a1), A.N. Sorokin (a1), M.R. Baklanov (a2) and K. Maex (a2)

Abstract

The direct influence of the applied electric field on ions of lattice, as a whole, was considered. This influence induces the strains and stresses and its gradients. In turn, this additional stresses may induce the vacancy (ion) diffusion flux. It is shown that this flux coincides in the direction and is comparable in magnitude with the electromigration flux induced by the electron wind.

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Electric Field Direct Force in Electromigration Mechanism

  • A.A. Karpushin (a1), A.N. Sorokin (a1), M.R. Baklanov (a2) and K. Maex (a2)

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