Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-25T22:27:25.525Z Has data issue: false hasContentIssue false
  • English
  • Français

The Effect of Ion Irradiation on Inert Gas Bubble Mobility

Published online by Cambridge University Press:  28 February 2011

Dale E. Alexander  and
R. C. Birtcher
Dale E. Alexander
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
R. C. Birtcher
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
Get access

Abstract

The effect of Al ion irradiation on the mobility of Xe gas bubbles in Al thin films was investigated. Transmission electron microscopy was used to determine bubble diffusivities in films irradiated and/or annealed at 673K, 723K and 773K. Irradiation increased bubble diffusivity by a factor of 2–9 over that due to thermal annealing alone. The Arrehnius behavior and dose rate dependence of bubble diffusivity are consistent with a radiation enhanced diffusion phenomenon affecting a volume diffusion mechanism of bubble transport.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 235: Symposium A – Phase Formation and Modification by Beam-Solid Interactions , 1991 , 545
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Luklinska, Z.H. and Goodhew, P.J., J. Nucl. Mater. 135, 201 (1985).CrossRefGoogle Scholar
[2] Yamaguchi, H., Hashimoto, I., Mitsuya, H., Nakamura, K. and Yagi, E., J. Nucl. Mater. 161, 164 (1989).CrossRefGoogle Scholar
[3] Sizmann, R., J. Nucl. Mater. 69/70, 386 (1978).CrossRefGoogle Scholar
[4] Allen, C.W., Funk, L.L., Funk, E.A., Ryan, E.A., and Taylor, A., Nucl. Instrum. Methods B 40/41, 553 (1989).CrossRefGoogle Scholar
[5] Biersack, J.P. and Haggmark, L.G., Nucl. Instrum. Methods 174, 257 (1980).CrossRefGoogle Scholar
[6] Electron Microscopy Society of America Bulletin 21 # 1, 83 (1991).Google Scholar
[7] Goodhew, P.J. and Tyler, S.K., Proceedings of the Royal Society of London A377, 151 (1981).Google Scholar
[8] Smithells Metals Reference Book, 6th edition, Ed. Brandes, E.A. (Butterworths, London, 1983)p. 13–5.Google Scholar
[9] Takaishi, K., Kikuchi, T., Furuya, K., Hashimoto, I., Yamaguchi, H., Yagi, E. and Iwaki, M., Phys. Stat. Sol. (a) 95, 135 (1986).CrossRefGoogle Scholar