Skip to main content Accessibility help
×
Home

The Effect of Interfacial Disorder on the X-Ray Diffraction of Superlattices

  • J. P. Locquet (a1), D. Neerinck (a1), W. Sevenhans (a1), Y. Bruynseraede (a1), H. Homma (a2) and Ivan K. Schuller (a3)...

Abstract

We have generalised our x-ray diffraction results from amorphous/crystalline multilayers, to include random interfacial disorder of a gaussian type. A general relation is obtained which can be applied to both crystalline/crystalline and crystalline/amorphous multilayers. This gaussian fluctuation or “roughness” can strongly reduce the long-range atomic order along the growth direction of the multilayer. Using classical structure factor calculations, we simulate the evolution of x-ray patterns as a function of the fluctuation amplitude, the superlattice wavelength, and the interatomic distances. Applying this model to the crystalline/crystalline case we fit the experimental Nb/Cu data, deduce a fluctuation amplitude of about 0.4 Å, and relate it to the lattice mismatch between Nb and Cu. For crystalline/amorphous systems (Pb/Ge) this amplitude can be significantly larger (2 Å).

Copyright

References

Hide All
1. For an early review, see de Fontaine, D., in Atomic Arrangements Studied by X-Ray Diffraction, edited by Cohen, J.B. and Hilliard, J.E. (Gordon and Breach, New York, 1966)
2. For a recent review, see McWhan, D.B., in Synthetic Modulated Structures, edited by Chang, L.L. and Giessen, B.C. (Academic Press, New York, 1985), Chap. 3
3. Hendricks, S. and Teller, E., J. Chem. Phys. 10, 147 (1942)
4. Segmüller, A. and Blakeslee, A.E., J. Appl. Cryst. 6, 19 (1973)
5. Schuller, I.K., Phys. Rev. Lett. 44, 1597 (1980)
6. Meyer, K.E., Felcher, G.P., Sinha, S.K. and Schuller, I. K., J. Appl. Phys. 52, 6608 (1981)
7. Jalochowski, M., Thin Solid Films, 101, 285 (1983)
8. McWhan, D.B., Gurvitch, M., Rowell, J.M. and Walker, L.R., J. Appl. Phys. 54, 3886 (1983)
9. Chrzan, D. and Dutta, P. J. Appl. Phys. 59, 1504 (1986)
10. Jalochowski, M. and Mikolajczak, P., J. Phys. F 13, 1973 (1983)
11. Carcia, P.F. and Suna, A., J. Appl. Phys. 54, 2000 (1983)
12. Nakayama, N., Takahashi, K., Shinjo, T., Takada, T. and Ichinose, H., Jap. J. Appl. Phys. 25, 552, (1986)
13. Fuji, Y., Ohnishi, T., Ishihara, T., Yamada, Y., Kawaguchi, K., Nakayama, N. and Shinjo, T., J. Phys. Soc. Japan 55, 251 (1986)
14. Sevenhans, W., Gijs, M., Bruynseraede, Y., Homma, H. and Schuller, I.K., Phys. Rev. B 34, 5955 (1986)
15. Clemens, B.M. and Gay, J.G., Phys. Rev. B 35, 9337 (1987)
16. McWhan, D.B., Proc. Nato ASI on “Physics, Fabrication and Applications of Multilayered structures” June 1987
17. Kahn, M.R., Chun, C.S.L., Felcher, G.P., Grimsditch, M., Kueny, A., Falco, C.M. and Schuller, I.K., Phys. Rev. B 27, 7186 (1983)
18. Durbin, S.M., Cunningham, J.E. and Flynn, C.P., J. Phys. F, 12, L75, (1982)
19. Lowe, W.P., Barbee, T.W. Jr, Geballe, T.H. and McWhan, D.B., Phys. Rev. B 24, 6193 (1981)
20. Locquet, J.P., Neerinck, D., Stockman, L., Bruynseraede, Y., Homma, H. en Schuller, I.K., to be published
21. Hilliard, J.E., in Modulated Structures, edited by Cowley, J.M., Cohen, J.B., Salamon, M.B. and Wuensch, B.J., (A.I.P. Conf. Proc.), 407 (1979)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed