Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
van Cleef, M.W.M.
Rath, J.K.
Rubinelli, F.A.
van der Werf, C.H.M.
and
Schropp, R.E.I.
1996.
Microcrystalline-crystalline silicon heterojunction solar cells using highly conductive thin p-type microcrystalline silicon window layers.
p.
429.
Danel, A.
Tardif, F.
and
Kamarinos, G.
1999.
Surface dopant concentration measurement using the Surface Charge Profiler (SCP) method: characterization of hydrogen and metallic contamination in silicon.
Materials Science and Engineering: B,
Vol. 58,
Issue. 1-2,
p.
64.