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Effect of Fast Electron Irradiation on Electrical and Optical Properties of CdGeAs2 and ZnGep2

Published online by Cambridge University Press:  10 February 2011

I. Zwieback
Affiliation:
INRAD Inc., Northvale, NJ
J. Maffetone
Affiliation:
INRAD Inc., Northvale, NJ
D. Perlov
Affiliation:
INRAD Inc., Northvale, NJ
J. Harper
Affiliation:
INRAD Inc., Northvale, NJ
W. Ruderman
Affiliation:
INRAD Inc., Northvale, NJ
K. Bachmann
Affiliation:
North Carolina State University, Raleigh, NC
N. Dietz
Affiliation:
North Carolina State University, Raleigh, NC
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Abstract

We report on the effects of fast electron irradiation on the optical absorption (α) of CdGeAs2and ZnGeP2 and on the electrical properties of CdGeAs2. In p-CdGeAs2 irradiation led to the reduction in α and an increase in the electrical resistivity. The lowest values of α (about 0.1 cm' at 5µm<λ<10µm) were obtained on irradiated crystals of p-type with the highest degree of compensation. Further accumulation of the electron dose caused conversion to n-type and deterioration of the optical transmission. In ZnGeP2 irradiation caused a decrease in a at λ>0.85 λm and increase in α at λ<0.85 μm. At λ=2.05 μm, α for the o-ray could be reduced to less than 0.08 cm−1. At higher doses, saturation in α was observed. The effects of irradiation are discussed in connection with possible mechanisms of optical absorption in CdGeAs2 and ZnGeP2.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

[1] Dmitriev, V.G., Gurzadyan, G.G., and Nikogosyan, D.N., Handbook of Nonlinear Optical Crystals, 2nd ed. (Springer-Verlag, 1997), p. 136, 176.Google Scholar
[2] Rud, Yu.V. and Masagutova, R.V., Sov. Tech. Phys. Lett., 7, 72 (1981).Google Scholar
[3,4] Dovletmuradov, Ch. et al. , Izv. AN Turkmen SSR, Ser.Fiz.-Tekh.,3, p. 106 (1972).Google Scholar
[5] Chng, L.L., Technical Report, DERA/EL/EOMC/TR990046/1.0, Malvern, UK (1999).Google Scholar
[6] Zwieback, I. and Ruderman, W., NSF Phase I Final Report, DMI-9461802, INRAD, (1995).Google Scholar
[7] Zwieback, I., Maffetone, J. and Ruderman, W., 1st Workshop The Control of Stoichiometry in Semiconductor Heterostructures, Suhl, Germany, August 1995 (unpublished).Google Scholar
[8] Borshchevsky, A.S., Route, R.K., and Feigelson, R.S., Mat. Res Bull., 15, 409 (1980).Google Scholar
[9] Brudnyi, V.N., Budnitskii, D.L., Krivov, M.A., Masagutova, R.V., Prochukhan, V.D. and Rud, Yu.V., Phys. Stat. Sol. A, 50, 379 (1978).Google Scholar
[10,11] Dietz, N. et al. , Appl. Phys. Lett. 65, 2759 (1994)Google Scholar
[12,13] Halliburton, L.E. et al. and Giles, N.C. et al. , Appl. Phys. Lett., 66, 1758, 2670 (1995).Google Scholar
[14] Setzler, S.D., Giles, N.C., Halliburton, L.E., Schunemann, P.G. and Pollak, T.M., Appl. Phys. Lett., 74, 1218 (1999).Google Scholar
[16] Krivov, M. A. et al. , Fiz. Tekh. Poluprov. 9, 1211 (1975) 10, 1311 (1976).Google Scholar
[17,18] Brudnyi, V. N. et al. , Phys. Stat. Sol. A, 35, 425 (1976), 49, 761 (1978).Google Scholar
[19] Watkins, G. D. in Radiation Damage in Semiconductors, ed. Baruch, P., Dunod, Paris, 1965.Google Scholar
[20] Kildal, H., Technical Report AFML-TR-72-277, 1972, Phys. Rev., B10, 5083 (1974).Google Scholar
[21] Zwieback, I., Perlov, D., Maffetone, J. and Ruderman, W., Appl. Phys. Lett., 73, 2185 (1998).Google Scholar