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The Effect of Annealing Conditions on Magnetron Sputtered Superconducting Tl-Based Thin Films

Published online by Cambridge University Press:  28 February 2011

S.H. Liou
S.H. Liou*
Affiliation:
Behlen Laboratory of Physics and Center for Materials Research and Analysis, University of Nebraska‐Lincoln, Lincoln, NE 68588‐0111
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Abstract

The annealing steps have been shown to be a crucial determinant of the quality of Tl‐based superconducting films. In this study, we discuss the formation of the superconducting Tl2Ba2CaCu2O8 and Tl2Ba2Ca2Cu3O10 phases with varied post‐annealing temperature and fixed annealing time. A x‐ray, electron micro‐probe, and scanning electron microscopy were carried out to evaluate the structure of superconducting phases formed for each annealing condition. For films deposited on SrTiO3 substrates and heat‐treated at 870°C for 15 min, the lower Tc phase Tl2Ba2CaCu2O8 becomes a major phase. The films consist of nearly pure Tl2Ba2Ca2Cu3O10 phase with Tc (R=0) in the range of 100K to 118K and c‐axis perpendicular to the film plane were obtained after annealing 880‐890°C for 15 min. These films were epitaxy growth on SrTi03 substrates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 667
Copyright
Copyright © Materials Research Society 1990

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