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DLTS study of 3C-SiC grown on Si using hexamethyldisilane

  • M. Kato (a1), M. Ichimura (a1), E. Arai (a1), Y. Masuda (a2), Y. Chen (a2), S. Nishino (a2) and Y. Tokuda (a3)...

Abstract

n-type 3C-SiC was heteroepitaxially grown on n-type Si(100) substrates using HMDS (hexamethyldisilane) and characterized by DLTS (deep level transient spectroscopy) measurements. In order to investigate relationship of defect density with epilayer thickness, epilayers with various thicknesses were grown. Relatively thin (<1.0μm thick) epilayers were found to contain defects with energy levels distributed in a wide energy range, while relatively thick (>2.2μm thick) epilayers contain a defect with an activation energy of 0.25eV. This defect level is slightly shallower than that in 3C-SiC grown by SiH4 and C3H8 (∼0.3eV).

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