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Dislocation—Impurity Interaction and its Effect on Semiconductor Properties

Published online by Cambridge University Press:  28 February 2011

E.B. Yakimov
E.B. Yakimov*
Affiliation:
Institute of Problems of Microelectronics Technology and High Purity Materials, USSR Academy of Sciences, 142432 Chernogolovka, Moscow District, USSR
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Abstract

The results confirming a significant role of dislocation—impurity interaction in changing local properties of plastically deformed semiconductor crystals have been presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 173
Copyright
Copyright © Materials Research Society 1989

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References

1. Eremenko, V.G., Nikitenko, V.I., Yakimov, E.B., Zh. Eksp. Teor. Fiz. 73, 1129 (1977) Soy. Phys. JETP 46, 598 (1977)Google Scholar
2. Bondarenko, I.E., Eremenko, V.G., Nikitenko, V.I., Yakimov, E.B., Phys. stat. TK sol. (a) 60, 341 (1980).Google Scholar
3. Isotov, A.N. and Steinman, E.A., Phys. slat. sol. (a) 104, 777 (1987).Google Scholar
4. Kimerling, L.C. and Patel, J.R., Appl. Phys. Lett. 34, 73– (1979).Google Scholar
5. Zolotukhin, M.N., Kveder, V.V., Ossipyan, Yu A., -Sagdeev, I.P., Fiz. Tverd. Tela 26, 1412 (1984).Google Scholar
6. Bondarenko, I.E., Yakimov, E.B., Yarykin, N. A., Acta Phys. Polon. A69,Google Scholar
7. Wöhler, F.D., Alexander, H., Sander, W., J. Phys. Chem. Sol., 31, 1381 393 (1986). (1970).Google Scholar
8. Aristov, V.V., Bondarenko, I.E., Heydenreich, J., Khodos, I.I., Snighireva, I.I., Werner, P., Yakimov, E.B., Yarykin, N.A., Phys. stat. sol. (a) 102, 687 (1987).Google Scholar
9. Yakimov, E.B., AYarykin, N., Nikitenko, V.I., Phys. stat. sol. (a) 84, 443 (1984).Google Scholar
10. Bondarenko, I.E., Eremenko, V.G., Farber, B.Ya., Nikitenko, V.I., Yakimov, E.B., Phys. stat. sol. (a) 68, 53 (1981).Google Scholar
11. Bondarenko, I.E., Blumtritt, H., Heydenreich, J., Kazmiruk, V.V., Yakimov, E.B., Phys. stat. sol. (a) 95, 173 (1986).Google Scholar
12. Nikitenko, V.I., Farber, B.Ya., Yakimov, E.B., Cryst. Res. Technol. 19 295 (1984).Google Scholar
13. Frigeri, C., in Abstracts of 15th International Conference on Defects in Semiconductors (Budapest, 1988) p. 79.Google Scholar
14. Emelin, V.Ya., Klassen, N.V., Negrii, V.D., Ossipyan, Yu A., J. Phys. Collog. 44, C4–125 (1983).Google Scholar