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Diffuse X-Ray Scattering Study of Cu3Au above the Order-Disorder Transition Temperature

Published online by Cambridge University Press:  28 February 2011

B. D. Butler  and
J. B. Cohen
B. D. Butler
Affiliation:
Northwestern University, Dept. of Materials Science and Engineering, Evanston, IL 60208.
J. B. Cohen
Affiliation:
Northwestern University, Dept. of Materials Science and Engineering, Evanston, IL 60208.
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Abstract

The x-ray diffuse scattering from a single crystal of Cu3Au was measured in absolute units in a volume of reciprocal space. The measurement was made while the crystal was held at 703 K (approximately 35 K above the critical temperature for ordering) and the measured intensity was separated into components due to short range order (SRO) and strain. The Warren short range order parameters, pair interaction potentials and the first and second order static atomic displacements were obtained by Fourier inversion of these separated intensities. The relative interatomic pair potentials, out to the third shell, were found to be V2/V 1=-0.5 and V3/V 10 consistent with earlier determinations. The first order atomic pair displacements were found to be contrary to what has previously been assumed: Au-Au first neighbor pairs were found to have negative displacements on average and AuCu pairs positive displacements, compared to the average interatomic distance.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 59
Copyright
Copyright © Materials Research Society 1989

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References

1. Cowley, J. M., J. Appl. Phys.,21, 24 (1950).Google Scholar
2. Moss, S. C., J. Appl. Phys., 35, 3547 (1964).Google Scholar
3. Bardhan, P., Cohen, J. B., Acta Cryst., A32, 597 (1976).Google Scholar
4. Georgopoulos, P., Cohen, J. B., J. Physique, 33, C7–191 (1977).Google Scholar
5. Clapp, P. C., Moss, s. C., Phys. Rev., 142(2), 418 (1966).CrossRefGoogle Scholar
6. Clapp, P. C., Moss, S. C., Phys. Rev., 171(3), 754 (1968).Google Scholar
7. Moss, S. C., Clapp, P. C., Phys. Rev., 171(3), 764 (1968).Google Scholar
8. Butler, B. D., Cohen, J. B., J. Appl. Phys., (In press).Google Scholar
9. Schwartz, L. H., Cohen, J. B., Diffraction from Materials, 2nd Edition, Springer-Verlag, N.Y. (1987).CrossRefGoogle Scholar
10. Warren, B. E., X-Ray Diffraction, Addison Wesley, Ma, (1969), p.244.Google Scholar