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Differential Hysteresigraph using the Transverse Magneto-Optic Kerr Effect Applied to Thin Magnetic Films
Published online by Cambridge University Press: 21 February 2011
Abstract
A simple differential set up for measuring changes in reflectivity of a flat surface of a ferromagnetic material, the so-called transverse magneto-optic Kerr effect, is described. The differential procedure is used with the aim of minimizing mechanical and optical noise.
Hysteresis cycles have been plotted for several ferromagnetic films of sputtered amorphous R-M alloys (R - Y, La; M - Co, Ni) and reveal good proportionality between ΔR/R, the relative change of reflectivity, and the magnetization measured with a SQUID magnetometer.
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