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Dielectric Properties of Electrostatic Self-Assembled (ESA) Films

  • Ramazan Asmatulu (a1), Brian Geist (a1), William B. Spillman (a1) and Richard O. Claus (a1)


Capacitance measurements were conducted to determine the dielectric constant of electrostatic self assembly (ESA) films over various temperature and frequency ranges at 1 mV and 15% relative humidity. Measurement electrodes were fabricated on the ESA films using silver grease and a brass bar. In these tests, polymeric nanofilms were fabricated on gold-coated glass slides using the ESA process. Thicknesses of the films were between 100 nm and 600 nm obtained by depositing different number bilayers of negatively charged Poly s-119 (PS-119) or heparin and positively charged poly(diallyldimethylammonium chloride) (PDDA). The test results showed that dielectric constant values were around 2. Based on the test results, we concluded that this is a technique that might prove useful to estimate the capacitance and dielectric constant values of nanostructured ESA films, which can be largely used in the near future.



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1 Decher, G. and Schlenoff, J.B.Multilayers Thin Films – Sequential Assembly of Nanocomposite Materials,” Wiley-VCH, 2003.
2 Liu, Y., Wang, A. and Claus, R., J. Physical Chemistry B 1997, 101, 13851388.
3 Liu, Y. and Claus, R., Appl. Phys. Lett. 85, 419 (1999).
4 Chandran, A. “Self-assembled Spectral Filters,” Unpublished data, FEORC, Virginia Tech.
5 Liu, Y., Wang, A. and Claus, R., Chemical Physics Letters 298(1998) 315319.
6 Asmatulu, R., Geist, B. Spillman, W., and Claus, R.O., March, 2005, SPIE, V. 5761, 3139.
7 Asmatulu, R., Geist, B. Spillman, W., and Claus, R.O., Unpublished data, FEORC, Virginia Tech, Blacksburg, VA.
8 Nalwa, H.S.Handbook of Low and High Dielectric Constant Materials and Their Applications – Materials and Processing – Vol. 1,” Academic Press, 1999.
9 Ho, P.S., Leu, J. and Lee, W.W. “Low Dielectric Constant Materials for IC Application,” Springer, 2003.
10 Callister, W.D. JrMaterials Science and Engineering – an Introduction, 5th Ed.,” John Wiley & Sons, Inc., 2000.
11ASTM Designation: D 150-98.
12 Dakhel, A.A., Journal of Alloys and Compounds 365 (2004) 233.
13 Sahu, D.R., Roul, B.K., Singh, S.K. and Choudhury, R.N.P., Mater. Lett. 56 (2002) 817.
14 Velumani, S., , Narayandass, Mangalaraj, S.K. D., Sebastian, P.J. and Mathew, X., Solar Energy Materials & Solar Cells 81(2004) 323.
15 Wagle, S. and Shirodkar, V., Brazilian Journal of Physics, V. 30, No. 3, Sep. 2000, 554.
16 Mathai, C.J., Saravanan, S. Anantharaman, M.R., Venkitachalam, S. and Jayalekshmi, S., Journal of Physics D: Applied Physics 35(2002) 240.
17 Paddison, S.J., Reagor, D.W. and Zawodzinski, T.A. Jr , Journal of Electroanalytical Chemistry 459(1998) 91.
18 Day, J.S., Landis, R.C. and Taylor, K.M., J Cardiovasc & Vasc Anesthesia 18; 93100, 2004


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