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Dielectric Properties of Electrostatic Self-Assembled (ESA) Films

  • Ramazan Asmatulu (a1), Brian Geist (a1), William B. Spillman (a1) and Richard O. Claus (a1)

Abstract

Capacitance measurements were conducted to determine the dielectric constant of electrostatic self assembly (ESA) films over various temperature and frequency ranges at 1 mV and 15% relative humidity. Measurement electrodes were fabricated on the ESA films using silver grease and a brass bar. In these tests, polymeric nanofilms were fabricated on gold-coated glass slides using the ESA process. Thicknesses of the films were between 100 nm and 600 nm obtained by depositing different number bilayers of negatively charged Poly s-119 (PS-119) or heparin and positively charged poly(diallyldimethylammonium chloride) (PDDA). The test results showed that dielectric constant values were around 2. Based on the test results, we concluded that this is a technique that might prove useful to estimate the capacitance and dielectric constant values of nanostructured ESA films, which can be largely used in the near future.

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