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Dielectric Measurements On Printed-Wiring And Circuit Boards, Thin Films, And Substrates: An Overview 1

  • James Baker-Jarvis (a1) and Chriss A. Jones (a1)

Abstract

A review of the most common methods of permittivity measurements on thin films, printed-wiring and circuit boards, and substrates is presented. Transmission-line techniques, coaxial apertures, open resonators, surface-wave modes, and dielectric resonators methods are examined. The frequency range of applicability and typical uncertainties associated with the methods are summarized.

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U.S. Government work not protected by U.S. copyright

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