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Dielectric and Ferroelectric studies of Pb0.85La0.15TiO3 Thin Films on solution derived RuO2 Bottom Electrodes

Published online by Cambridge University Press:  21 March 2011

S. Bhaskar ,
S. B. Majumder ,
P. S. Dobal ,
S. B. Krupanidhi  and
R. S. Katiyar
S. Bhaskar
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras campus, San Juan, PR 00931.
S. B. Majumder
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras campus, San Juan, PR 00931.
P. S. Dobal
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras campus, San Juan, PR 00931.
S. B. Krupanidhi
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore- 560012., India.
R. S. Katiyar
Affiliation:
Department of Physics, University of Puerto Rico, Rio Piedras campus, San Juan, PR 00931.
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Abstract

Sol-Gel derived Pb0.85La0.15TiO3 PLT15) thin films were deposited on solution derived RuO2/Si, RuO2/Pt/Si and Pt bottom electrodes. Dielectric, tangent loss, hysteresis, J-E, measurements were also carried out on these films. X-ray results established the single phase perovskite formation with no secondary phases of PLT15 thin film on these electrodes. PLT15 thin films on RuO2 bottom electrode showed relatively inferior ferroelectric and dielectric behavior as compared to Pt electrode. Low leakage currents (10-8 A/cm2 at 10 kV/cm) and the observed J-E characteristics have been attributed to poor film-electrode interface. Observed electrical and dielectric properties have been correlated with the film-electrode interface. The interface characteristics were further augmented by depth profile analysis using Auger Electron Spectroscopy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 672: Symposium O – Mechanisms of Surface and Microstructure Evolution in Deposited Films and Film Structures , 2001 , O9.3
Copyright
Copyright © Materials Research Society 2001

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References

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