Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-19T21:34:03.117Z Has data issue: false hasContentIssue false
  • English
  • Français

Dewetting of A Complex Polymer: Perfluoro-Ionomer

Published online by Cambridge University Press:  17 March 2011

Teresa A. Hill ,
Xuesong Jiao ,
Charles W. Martin  and
Dvora Perahia
Teresa A. Hill
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A.
Xuesong Jiao
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A. Materials Science and Engineering, Clemson University, Clemson, SC 29634, U.S.A
Charles W. Martin
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A. Currently at Gore and Associates, Newark, DE
Dvora Perahia*
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A. Materials Science and Engineering, Clemson University, Clemson, SC 29634, U.S.A
*
Author for correspondence
Get access

Abstract

The stability and interfacial structure of ultra thin films of perfluoro-ion containing polymers (ionomers) have been studied using atomic force microscopy and neutron reflectometry. These complex polymers have significant technological applications from thin coatings, to fuel cells as polymer electrolyte membranes, to protective clothing. In particular we focused on the study of [(CF2CF2)n (CF2CFR)]m where R= [OCF2CF2SO3 (X)] and X=H, (800 equivalent weight), coated on silicon oxide. Neutron Reflectometry has shown that film consists of three distinct regions: a region of high density at the interface with the silicon oxide, an intermediate layer with constant density and an air-interface layer where the density decreases due to interfacial roughness. In contrast to noionic polymers, the films proven stable as a function of annealing time above the bulk glass transition, i.e the films do not dewet. This stability is attributed to electrostatic interactions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 710: Symposia DD – Polymer Interfaces and Thin Films , 2001 , DD13.9.1
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Mater. Res. Soc. Bulletin (1996); A special issue dedicated to polymers at interfaces.Google Scholar
2. Perahia, D., Weisler, D., Satija, S. K., Fetters, L. J., and Sinha, S. K., Phys. Rev. Letters 72, 100, (1994); J. Klein, E. Kumacheva, D. Mahalu, D. Perahia, and L. J. Fetters; Nature 370, 634, (1994).Google Scholar
3. Suh, K.Y. and Hong Lee, H., Phys. Review Letters 87, 8713, (2001); G. Reiter, Phys. Rev. Letters 87, 8718 (2001).Google Scholar
4. Bucknall, D.G., Butler, S. A., Higgins, J.S., Journal of Physics and Chemistry of Solids 60, 1273, (1999).Google Scholar
5. Lin, E. K., Kolb, R., Satija, S. K., and Wu, W., Macromolecules 32, 3753, (1999).Google Scholar
6. Yim, H., Kent, M. and McNamara, W.F., Macromolecules 32, 7932, (1999).Google Scholar
7. Sauer, B. B. and McLean, R. S., Macromolecules 33, 7939, (2000).Google Scholar
8. McLean, R. S., Doyle, M., and Sauer, B.B., Macromolecules 33, 6541, (2000).Google Scholar
9. Hill, T. A., Jiao, X., Martin, C. W., Demarteau, D.D. and Perahia, D., “Wetting of Ion Containing Polymers: Micelles Versus Molecular Absorption”, edited by Drake, J.M., Grest, G.S., Klafter, J., and Kopelman, R., Mater. Res. Soc. Proc. 543, Boston, MA, (1998) pp. 189–194.Google Scholar
10. Martin, C. W., Gordon, T. D., Baker, S. H., and Davila, M., “Forming thin, durable coatings of ion-containing polymers on selected substrates”, European patent appl., WO 9524976 (1995)Google Scholar
11.The software has been developed by Dr. Alan Munter, Currently NCNR at NIST, at 100 Bureau Drive Stop 8562, Gaithersburg, MD 20899-8562.Google Scholar
12. Steitz, R., Leiner, V., Siebrecht, R. and Klitzing, R. V., Colloids and Surfaces A: Physicochemical and Engineering Aspects 163, 63, (2000).Google Scholar
13. Srolovitz, D. J. and Safran, S. A., J. Appl. Phys. 60, 247, (1986).Google Scholar
14.In preparation.Google Scholar