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Developments in the Tem Examination Of Pu and Pu Alloys

Published online by Cambridge University Press:  21 February 2011

T. G. Zocco
Affiliation:
Materials Science and Technology Division Los Alamos National Laboratory, Los Alamos, NM 87545
D. L. Rohr
Affiliation:
Materials Science and Technology Division Los Alamos National Laboratory, Los Alamos, NM 87545
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Abstract

Microstructural characterization of plutonium utilizing Transmission Electron Microscopy (TEN) has previously been difficult because of the extreme toxicity and high oxidation rate of plutonium metal. Recent developments in plutonium sample preparation have shown that foils of both alpha and delta phases of plutonium may be prepared for TEN without the use of inert atmospheric systems or complex preparation devices. Samples may be produced, using standard electropolishing techniques, that yield important microstructural data on plutonium and plutonium alloys.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Rohr, D.L. and Staudhammer, K.P., J. Nucl. Mater. 144, 202 (1987).CrossRefGoogle Scholar
2. Rohr, D.L., Staudhammer, K.P., Johnson, K.A., Los Alamos Report, LA-9965-MS (March 1984).Google Scholar
3. Johnson, K.A., Staudhammer, K.P., Stevens, M.F., Unpublished research.Google Scholar
4. Brewer, A.W. and Fraikor, F.J., J. Nucl. Mater. 21, 345 (1967).Google Scholar
5. Douglass, D.L. and Bronisz, S.E., J. Nucl. Mater. 23, 107 (1967).Google Scholar
6. Ekbom, L., Johansson, U., Tornquist, M., J. Nucl. Mater. 24, 230 (1967).Google Scholar
7. Staudhammer, K. P., Johnson, K. A., Stevens, M. F., and Medina, W. J., 44th Proc. Ann. EMSA Meeting, edited by Bailey, G. W. (San Francisco Press, 1986), p. 564.Google Scholar
8. Choudhry, M.A. and Crocker, A.G., J. Nucl. Mater. 127, 119 (1985).Google Scholar
9. Zukas, E.G., Hecker, S.S., Morgan, J.R., Pereyra, R.A., Proc. Conf. Solid-Solid Phase Transformations, Edited by Aaronson, H. (The Metallugical Society of AIME, 1982), pp. 13331337.Google Scholar
10. Hecker, S.S., Zukas, E.G., Morgan, J.R., Pereyra, R.A., Proc. Conf. Solid-Solid Phase Transformations, Edited by Aaronson, H. (The Metallugical Society of AIME,1982) pp. 13391343.Google Scholar
11. Baker, R.D., Hecker, S.S., Harbur, D.A., Los Alamos Science Winter/Spring 1983, pp. 142151.Google Scholar
12. Ellinger, F.H., Land, C.C., Struebing, V.O., J. Nucl. Mater. 12, 226 (1964).Google Scholar
13. Thompson-Russell, K.C. and Edington, J.W., Practical Electron Microscopy in Materials Science, Monograph 5, (The Macmillan Press Ltd., London, 1977).Google Scholar
14. Murr, L.E., Electron and Ion Microscopy and Microanalysis, (Marcel Dekker, Inc., New York, 1982), p. 686.Google Scholar
15. Pereyra, R.A., private communication.Google Scholar