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Development of a low energy Ne atom scattering system for insulator surface strctural analysis

  • Kenji Umezawa (a1), E Narihiro (a2), K Oda (a3), Shigemitsu Nakanishi (a4) and Walter M Gibson (a5)...

Abstract

We have been developing a low energy Ne atom scattering system combined with a time-of-flight spectrometer for insulator surface structural analysis. Insulator surface structure is difficult to study because of charging effects during electron or ion beam bombardment. Structural analyses of insulator surfaces are very important in fundamental research as well as technology fields. In our system, charged ion beams of 2 keV-Ne+ are converted into neutral beams by charge exchange with the same element gas after the primary beam passes through a chopper. Other features of this system are pulsed beams, time-of-flight measurements, and a micochannel plate (MCP) detector is coaxially mounted along the primary beam. This is a home made equipment. We will show the detection systems, as well.

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5 Fujii, S., Michishita, Y., Miyamae, N., Oura, K., Katayama, M., Nucl. Instrum. Meth. B 232, 290 (2005).

Keywords

Development of a low energy Ne atom scattering system for insulator surface strctural analysis

  • Kenji Umezawa (a1), E Narihiro (a2), K Oda (a3), Shigemitsu Nakanishi (a4) and Walter M Gibson (a5)...

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