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Determination of the Specific Site Occupation of Rare Earth Additions in Y17Sm06,Lu07Fe5O12Thin Films by the Orientation Dependence of Characteristic x-Ray Emissions

Published online by Cambridge University Press:  21 February 2011

Kannan M. Krishnan ,
Peter Rez ,
Raja Mishra  and
Gareth Thomas
Kannan M. Krishnan
Affiliation:
Lawrence Berkeley Laboratory, Materials and Molecular Research Division, National Center for Electron Microscopy, University of California, Berkeley, CA 94720
Peter Rez*
Affiliation:
Lawrence Berkeley Laboratory, Materials and Molecular Research Division, National Center for Electron Microscopy, University of California, Berkeley, CA 94720
Raja Mishra
Affiliation:
Lawrence Berkeley Laboratory, Materials and Molecular Research Division, National Center for Electron Microscopy, University of California, Berkeley, CA 94720
Gareth Thomas
Affiliation:
Lawrence Berkeley Laboratory, Materials and Molecular Research Division, National Center for Electron Microscopy, University of California, Berkeley, CA 94720
*
*Present address: V. G. Microscopes, Ltd., England.
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Abstract

The orientation dependence of characteristic x-ray emissions have been used to determine specific site occupations of Rare Earth additions in epitaxially grown films of Y1.7Sm0.6 Lu0.7Fe12.A.theoretical formulation based on the assumption of highly localiszed inner shell excitations was used not only to oredict specific site sensitive orientations, but also to refine experimentally observed data employing a constrained least squares analysis to give probabilities for the occupation of the RE additions in the different crystallographic sites. Thus, it has been shown that in this compound the preference for the RE additions is a predominantly octahedral occupation with a probability ≳95%. Some of theassumptions and limitations of the technique have also been discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 79
Copyright
Copyright © Materials Research Society 2006

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References

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