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Degradation Mechanism in GaAs Led

  • Zhou Jicheng (a1), Fu Zhiping (a1), Zhan Qianbao (a1) and Feng Shuifu (a1)

Abstract

A series of experiments have been performed to verify the nature of hole trap A and B in GaAs proposed by Zou and revised by Zhou (one of the present authors). The relative concentration of these two Craps is responsible for the degradation behavior of the diodes. Accordingly, the degradation mechanism in GaAs LED can be reasonably deduced based on thermodynamic consideration.

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Degradation Mechanism in GaAs Led

  • Zhou Jicheng (a1), Fu Zhiping (a1), Zhan Qianbao (a1) and Feng Shuifu (a1)

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