Hostname: page-component-77c89778f8-vpsfw Total loading time: 0 Render date: 2024-07-17T12:45:18.342Z Has data issue: false hasContentIssue false

Defect Studies of GaN under Large Hydrostatic Pressure

Published online by Cambridge University Press:  21 February 2011

C. Wetzel
Affiliation:
Lawrence Berkeley National Laboratory and University of California, Berkeley, CA 94720, USA
S. Fischer
Affiliation:
Lawrence Berkeley National Laboratory and University of California, Berkeley, CA 94720, USA
W. Walukiewicz
Affiliation:
Lawrence Berkeley National Laboratory and University of California, Berkeley, CA 94720, USA
J. Ager III
Affiliation:
Lawrence Berkeley National Laboratory and University of California, Berkeley, CA 94720, USA
E.E. Haller
Affiliation:
Lawrence Berkeley National Laboratory and University of California, Berkeley, CA 94720, USA
I. Grzegory
Affiliation:
Unipress, Polish Academy of Sciences, Warszawa, Poland
S. Porowski
Affiliation:
Unipress, Polish Academy of Sciences, Warszawa, Poland
T. Suski
Affiliation:
Lawrence Berkeley National Laboratory and University of California, Berkeley, CA 94720, USA
Get access

Abstract

GaN plays a key role in the exploration of the properties of group-Ill nitrides. As grown GaN often shows a high electron concentration, e.g. 1019 cm−3, of as yet unidentified origin. Applying large hydrostatic pressure we studied the behavior of these donors and a frequently observed strong luminescence band at 3.42 eV. We find a drop of the electron concentration to 3×1017 cm−3 at 27 GPa and derive a binding energy of 126 meV for the neutral singlet donor level at this pressure. Such a pressure behavior of a donor is consistent with the model of strongly localized defects. Within the framework of a bandstructure calculation we predict the neutral level of this donor at 0.40 ± 0.10 eV above the conduction band edge at ambient pressure.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Akasaki, I., Amano, H., Koide, N., Kotaki, M., Manabe, K., Physica B 185, 428 (1993).Google Scholar
2 Nakamura, S., Senoh, M., and Mukai, T., Appl. Phys. Lett. 62, 2390 (1993).Google Scholar
3 Barker, A.S. Jr. and Ilegems, M., Phys. Rev. B 7, 743 (1973).Google Scholar
4 Jenkins, D.W., Dow, J.D., and Tsai, Min-Hsiung, J. of Appl. Phys. 72, 4130 (1992).Google Scholar
5 Boguslawski, P., Briggs, E., White, T.A., Wensell, M.G., and Bernholc, J. in Diamond. SiC and Nitride Wide-Bandgap Semiconductors, edited by Carter, C.H. Jr, Gildenblat, G., Nakamura, S. and Nemanich, R.J., (Mat. Res. Soc. Proc. 339 Pittsburgh, PA 1994) p. 693.Google Scholar
6 Neugebauer, J. and Van de Walle, C. G., Phys. Rev. B 50, 8067 (1994).Google Scholar
7 Mizuta, M., Tachikawa, M., Kukimoto, H., and Minomura, S., Jpn. J. Appl. Phys. 24, L143 (1985).Google Scholar
8 Fischer, S., Wetzel, C., Haller, E.E., and Meyer, B.K.; Appl. Phys. Lett. 67, 1298 (1995).Google Scholar
9 Fischer, S., Wetzel, C., Hansen, W.L., Bourret, E., and Haller, E.E., unpublished.Google Scholar
10 Perlin, P., Gorczyca, I., Christensen, N.E., Grzegory, I., Teisseyre, H., and Suski, T., Phys. Rev. B 45, 13307 (1992).Google Scholar
11 Wetzel, C., Volm, D., Meyer, B.K., Pressel, K., Nilsson, S., Mokhov, E.N., and Baranov, P.G., Appl. Phys. Lett. 65, 1033 (1994).Google Scholar
12 Chung, B.-C. and Gershenzon, M., J. Appl. Phys. 72, 651 (1992).Google Scholar
13 Wetzel, C., Walukiewicz, W., Haller, E.E., Amano, H., and Akasaki, I., (Mat. Res. Soc. Proc. 378, Pittsburgh, PA 1994) p. 509Google Scholar
14 Kozawa, T., Kachi, T., Kano, H., Taga, Y., Hashimoto, M., Koide, N., and Manabe, K., J. Appl. Phys. 75, 1098 (1994).Google Scholar
15 A detailed analysis will be given in a forthcoming paper: Wetzel, C., Walukiewicz, W., Haller, E.E., Ager III, J., Grzegory, I., Porowski, S., and Suski, T., unpublished.Google Scholar
16 Arguello, C.A., Rousseau, D.L., and Porto, S.P.S., Phys. Rev. 181, 1351 (1969).Google Scholar
17 Perlin, P., Jauberthie-Carillon, C., Itie, J.P., San Miguel, A., Grzegory, I., Polian, A., Phys. Rev. B, 45, 83 (1992).Google Scholar
18 Christensen, N.E. and Gorczyca, I., Phys. Rev. B 50, 4397 (1994).Google Scholar