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Defect Density in Doped a-Si:H Films

  • K. Pierz (a1), H. Mell (a1) and W. Fuhs (a1)

Abstract

We compare the experimentally observed correlation between the density of charged dangling–bond defects and the Fermi–level position in n– and p–type a–Si:H films with the predictions of two hydrogen–related models for the thermal equilibrium state at the glass–transition temperature of the hydrogen glass in a–Si:H. Reasonable agreement is obtained with a defect reaction in which the transfer of hydrogen from Si–H bonds to weak bonds is limited to distances comparable to one atomic spacing. The results for p–type (boron–doped) films suggest that the formation of positively charged dangling–bond defects is not only determined by electronic energy differences but also by a relaxational energy gain of approximately 0.2eV.

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Pierz, K., Fuhs, W., and Mell, H., J. Non-Cryst. Solids 114, 651 (1989)
2. Bar-Yam, Y., Adler, D., and Joannopoulos, J.D., Phys. Rev. Lett. 57, 467 (1986)
3. Smith, Z.E. and Wagner, S., in Advances in Disordered Semiconductors, edited by Fritzsche, H. (World Scientific, Singapore, 1989), p. 409
4. Pierz, K., Fuhs, W., and Mell, H., to be published
5. Street, R.A. and Winer, K., Phys. Rev. B 40, 6236 (1989)
6. Kakalios, J. and Jackson, W.B., in Advances in Disordered Semiconductors, edited by Fritzsche, H. (World Scientific, Singapore, 1989), p. 207
7. Beyer, W., Herion, J., and Wagner, H., J. Non-Cryst. Solids 114, 217 (1989)
8. Pierz, K., Hilgenberg, B., Mell, H. and Weiser, G., J. Non-Cryst. Solids 97/98, 91 (1987)
9. Street, R.A., Hack, M. and Jackson, W.B., Phys. Rev. B 37, 4209 (1988)

Defect Density in Doped a-Si:H Films

  • K. Pierz (a1), H. Mell (a1) and W. Fuhs (a1)

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