Skip to main content Accessibility help
×
Home

Crystallization Rate and Thermal Stability of Te-Based Alloy Thin Films for Erasable Optical Recording

  • R. C. Ross (a1), D. A. Strand (a1), E. J. Bjornard (a1) and J. P. Deneufville (a1)

Abstract

Erasure speed and thermal stability of a number of Te-based alloys have been measured and compared. A distinct trend of increasing crystallization temperature, Tx, and increasing minimum time required for crystallization, τx, with increasing crosslinking element content is observed. Films which crystallize to form Te are stability limited at Tx≈80°C for τx≈┐μsec. Films which crystallize to form Sb40Te45Se15 have Tx160°C at τx≈┐μsec. Static tester recrystallization kinetics and direct observation of cycled tracks by optical and electron microscopy indicate that recrystallization occurs via epitaxial growth from peripheral crystallities and not from internally dispersed nuclei for all materials studied. Thus, crystallization speed is limited by three factors: the intrinsic maximum crystallization velocity of the pure crystal, the diffusion rate of crystal-insoluble crosslinking elements away from the crystallization front, and the geometry of the amorphous and peripheral crystalline zones

Copyright

References

Hide All
1. Ovshisnky, S.R., U.S. Patent No. 3,530,441, September 22, 1970.
2. Bell, A.E. and Spong, F.W., Appl. Phys. Lett., 38, 920 (1981).
3. Takenaga, M., Yamada, N., Ohara, S., Hishiuchi, K., Nagashima, M., Kashihara, T., Nakamura, S., and Yamashita, T., in Optical Storage Media, Bell, A.E. and Jamberdino, A.A. eds., Proc. SPIE 420, 172 (1983).
4. Clemens, P.C., Appl. Opt., 22, 3165 (1983).
5. Chen, M., Rubin, K.A., Marrello, U., Gerber, U.G., and Jipson, V.B., Appl. Phys. Lett., 46, 734 (1985).
6. van Uijen, C.M.J., in Optical Mass Data Storage, Proc. SPIE 529, 2 (1985).
7. Chen, M., Rubin, K.A., and Barton, R.W., ‘New Ideas for Phase-Change Media - Achieving Sub-Microsecond Erase with Data Stability’, in Digest of Technical Papers at the Topical Meeting on Optical Data Storage, IEEE Catalog No 85CH2234–3, p. PDP–l (1985).
8. Rubin, K.A., Barton, R., Rugar, D., Chen, M., Jipson, V., and Dewey, T., in Symposium on Mass Memory Technologies, at Materials Research Society 1985 Spring Meeting, April 15–18, 1985 (unpublished).

Crystallization Rate and Thermal Stability of Te-Based Alloy Thin Films for Erasable Optical Recording

  • R. C. Ross (a1), D. A. Strand (a1), E. J. Bjornard (a1) and J. P. Deneufville (a1)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed