Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-26T10:52:43.257Z Has data issue: false hasContentIssue false

Cross-Sectioning Magnetic Thin Films for Tem

Published online by Cambridge University Press:  21 February 2011

H.-M. Ho
Affiliation:
Department of Materials Science & Mineral Engineering and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
G. Thomas
Affiliation:
Department of Materials Science & Mineral Engineering and Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
C. N. Schooley
Affiliation:
Electron Microscope Lab., U. C. Berkeley, CA 94720
J.-S. Gau
Affiliation:
Control Data Company, Minneapolis, MN 55435
Get access

Abstract

Oblique incidence magnetic thin films are considered to be the most appropriate recording media for the next generation of video tape applications. In order to study the microstructure of such thin films, a specimen preparation technique employing ultramicrotomy has been developed. Because oblique incidence thin films have a porous structure and poor adhesion to the substrate, the problem of splitting of the thin films from the substrate is severe. This problem is reduced considerably by the following exercises: 1. using an acrylic embedding resin e.g. LR White (London Resin Co.), 2. thorough degreasing with solvents, 3. using a 55° diamond knife, and 4. trimming the block with a microtome before actual sectioning. The details of this preparation technique and some results obtained with this technique are presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Ozawa, K., Masuya, H., and Takahashi, M., Journal of Magnetism and Magnetic Materials, 40, 175 (1983).Google Scholar
2. Thomas, G., Transmission Electron Microscopy of Metals, (John Wiley & Sons, New York, 1962), p. 182.Google Scholar
3. Csencsits, R., Schooley, C., and Gronsky, R., Journal of Electron Microscopy Technique, 2, 643 (1985).Google Scholar
4. Murphy, J. A. and Price, R. L., in Proceedings of the 41st Annual Meeting of the Electron Microscopy Society of America. edited by G. W. Bailey, (San Francisco Press, San Francisco, 1983), p. 624.Google Scholar