Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-24T01:11:31.782Z Has data issue: false hasContentIssue false

Creep Mechanisms in Equiaxed and Lamellar Ti-48Al

Published online by Cambridge University Press:  21 March 2011

G. B. Viswanathan
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210
S. Karthikeyan
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210
V. K. Vasudevan
Affiliation:
Department of Materials Science and Engineering, University Of Cincinnati, Cincinnati, OH 45221
M. J. Mills
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210
Get access

Abstract

Minimum creep rates as a function of stress have been obtained for Ti-48Al binary alloy with a near gamma and a fully lamellar microstructure. TEM investigation reveals that deformation structures in both microstructures are dominated by jogged screw 1/2[110] dislocations in γ phase. A modif ied jogged screw model is adopted to predict minimum creep rates where the rate controlling step is assumed to be the non-conservative motion of 1/2[110] unit dislocations. In the case of equiaxed microstructure where the deformation was mostly uniform, the creep rates predicted by this model were in agreement with experimental values. Conversely, deformation in lamellar microstructures were highly inhomogeneous where the density of jogged 1/2[110] unit dislocations were seen in varying proportions depending on the width of the γ laths. The creep rates and stress exponents in these microstructures is explained in terms of active volume fractions of γ laths participating in deformation for a given applied stress.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Kim, Y. W., JOM, 41, 24 (1989).Google Scholar
2. Beddoes, J., Wallace, W. and Zhao, L., Int. Mater. Rev., 40, p. 197 (10995)Google Scholar
3. Viswanathan, G. B. and Vasudevan, V. K. Gamma Titanium Aluminides, ed. Kim, Y-W, Wagner, R. and Yamakuchi, M. (eds.), TMS, Warrendale, Pennsylvania, p.967(1995).Google Scholar
4. Parthasarathy, T.A., Mendiratta, M.G. and Dimiduk, D.M., Scripta Matel, 37 p.315 (1997)10.1016/S1359-6462(97)00099-7Google Scholar
5. Lu, M. and Hemker, K.J., Acta. Mater., 45 (1997) 3573 10.1016/S1359-6454(97)00063-3Google Scholar
6. Viswanathan, G.B., Vasudevan, V.K. and Mills, M.J., Acta Mater., 47 p.1399 (1999)10.1016/S1359-6454(99)00021-XGoogle Scholar
7. Skrotzki, B, Rudolf, T., Dlouhy, A. and Eggeler, G., Scripta Materialia, 39 p.1545 (1998)10.1016/S1359-6462(98)00346-7Google Scholar
8. Wang, J.N. and Nieh, T. G., Acta. Mater., 46 (1998) 1887 10.1016/S1359-6454(97)00434-5Google Scholar
9. Viswanathan, G. B., Ph.D. Thesis (1998)Google Scholar
10. Barrett, C. R. and Nix, W. D., Acta Metall., 13 p. 1247 (1965),10.1016/0001-6160(65)90034-9Google Scholar
11. Parthasarathy, T.A, Subramanian, P.R., and Dimiduk, D.M., Acta. Mater., 48, p. 541 (2000).Google Scholar
12. Parthasarathy, T.A., Keller, M. and Mendiratta, M.G., Scripta Matl, 38 p.1025 (1998).Google Scholar
13. Nix, W.D., Scripta Materialia, 39(4/5) (1998) 545 Google Scholar