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The Contrast of Dislocations in X-Ray Topographs of Homogeneously Bent Silicon Crystals

Published online by Cambridge University Press:  26 February 2011

Neil Loxley  and
Brian K. Tanner
Neil Loxley
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K.
Brian K. Tanner
Affiliation:
Physics Department, University of Durham, South Road, Durham, DH1 3LE, U.K.
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Abstract

The contrast of dislocations in X-ray transmission topographs has been studied as a function of specimen curvature. It has been shown that in the symmetric Laue geometry, contrast differences between Lang and Hirst Curved Crystal topographs are attributable to inhomogeneous bending of the specimen wafers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 209
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1. Tanner, B.K., X-Ray Diffraction Topography,(Pergammon Press, Oxford, 1976).Google Scholar
2. Dionne, G., J. Appl. Phys. 38, 4094 1967.Google Scholar
3. Tanner, B.K. and Humphreys, C.J., J. Phys. D: Appl. Phys. 3, 1144 1970.Google Scholar
4. Lang, A.R., Acta Cryst. 12, 249 1959.Google Scholar
5. Wallace, C.A. and R.Ward, C.C., J. Appl. Cryst. 8, 281 1975.Google Scholar
6. Lyons, M.H., (private communication).Google Scholar
7. Meieran, E.S. and Blech, I.A., J. Appl. Phys. 43, 265 1972.Google Scholar
8. Kato, N., J. Phys. Soc. Japan 18, 1785 1963.CrossRefGoogle Scholar
9. Kato, N., J. Phys. Soc. Japan 19, 67 1964; 19, 971 (1964).Google Scholar
10. Zsoldos, L., presented at the International Union of Crystallography 13th International Congress, Hamburg, 1984. (Acta Cryst. A40 Supplement (1984)).Google Scholar