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Composition of uranium oxide surface layers analyzed by μ-Raman Spectroscopy

Published online by Cambridge University Press:  01 February 2011

Wigbert J. Siekhaus
Wigbert J. Siekhaus*
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
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Abstract

Oxide thickness and composition averaged over a few square millimeter have been measured with nm thickness resolution by diffuse reflectance Fourier transform infrared (FTIR) spectroscopy. μ-Raman spectroscopy has been done on powders and bulk samples in the past, and can now be done on surfaces layers with μm lateral and depth resolution using con-focal microscopy. Here we apply con-focal-microscopy-based μ -Raman spectroscopy to a freshly polished/lightly oxidized and to heavily oxidized uranium to determine its sensitivity. The spectra show that μ-Raman spectroscopy does detect oxide thickness and oxide composition with high sensitivity.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 802: Symposium DD – Actinides - Basic Science, Applications, and Technology , 2003 , DD5.10
Copyright
Copyright © Materials Research Society 2004

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References

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