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A Comparative Study of Structural, Magnetic, and Transport Properties of Co-Re Superlattices Sputtered on Glass and Si Substrates

Published online by Cambridge University Press:  03 September 2012

J.L. Leal
Affiliation:
CFNUL, Av. Prof. Gama Pinto 2, 1699 Lisbon, Portugal
N.P. Barradas
Affiliation:
CFNUL, Av. Prof. Gama Pinto 2, 1699 Lisbon, Portugal
J.C. Soares
Affiliation:
CFNUL, Av. Prof. Gama Pinto 2, 1699 Lisbon, Portugal
M.F. da Silva
Affiliation:
LNETI, EN 10, 2685 Sacavem, Portugal
M. Rots
Affiliation:
IKS-KUL, Celestijnenlaan 200 D, 3001 Leuven, Belgium
P.P. Freitas
Affiliation:
INESC, R. Alves Redol 9–3, 1000 Lisbon, Portugal IST, R. Rovisco Pais 1000, Lisbon, Portugal
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Abstract

Antiferromagnetically coupled (Co17A°Re5A°)×15 superlattices were deposited simultaneously onto glass and Si substrates, with an intervening Re buffer layer. Samples grown on glass show sharper interfaces than those grown on Si. This effect reflects on Magnetoresistance, Magnetization, Rutherford backscattering, and hyperfine field results. The influence of the Re buffer layer thickness and annealing temperature on these properties is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

1- Freitas, P.P., Melo, L.V., Trindade, I.G., From, M., Ferreira, J., and Monteiro, P., Phys. Rev. B 45, 2495 (1992)Google Scholar
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