Skip to main content Accessibility help
×
Home

Characterization of Retention Phenomena of Micron-Size Electrical Domains in Pzt Thin Films

  • Seungbum Hong (a1), Hyunjung Shin (a2), Y. Eugene Pak (a2) and Kwangsoo No (a1)

Abstract

The retention phenomena of purposely aligned micron-size domains (defined as “bits”) in Pb(Zr,Ti)O3 thin films were characterized by atomic force microscopy (AFM) combined with a lock-in amplifier. It is found that the retention loss occurs by “region by region” showing local variation of the rate of the loss. Furthermore, the total retention loss can be successfully described by an extended exponential decay, which implies a narrow distribution of the relaxation times of the domains. This probably comes from the fact that the micron-size bits consist a few hundreds of domains. Along with the characterization, the effects of the bit size and the poling time per unit area on the retention characteristics were investigated. Based on our observations, it is concluded that the retention time is proportional to both the poling time per unit area and the bit size. This trend is successfully explained by a kinetic model developed by our group.

Copyright

References

Hide All
1. Hidaka, T., Maruyama, T., Sakai, I., Saitoh, M., Wills, L. A., Hiskes, R., Dicarolis, S. A., Amano, Jun, and Foster, C. M., Integrated Ferroelectrics 17, p. 319 (1997).10.1080/10584589708013006
2. Gruverman, A., Tokumoto, H., Prakash, A. S., Aggarwal, S., Yang, B., Wuttig, M., Ramesh, R., Auciello, O., Venkatesan, T., Appl. Phys. Lett. 71(24), 3492 (1997).10.1063/1.120369
3. Shulze, W. A. and Ogino, K., Ferroelectrics 87, 361 (1988).10.1080/00150198808201399
4. Lee, J. J., Thio, C. L., and Desu, S. B., Phys. Stat. Sol. (a) 151, 171 (1995).10.1002/pssa.2211510120
5. Gruverman, A. L., Hatano, J. and Tokumoto, H., Jpn. J. Appl. Phys. 36, 2207 (1997).10.1143/JJAP.36.2207
6. Auciello, O., Gruverman, A., Tokumoto, H., Prakash, S. A., Aggarwal, S., Ramesh, R., MRS Bulletin 23 (1), 33 (1998).10.1557/S0883769400031444
7. Colla, E. L., Hong, S., Taylor, D. V., Tagantsev, A. K., No, K., and Setter, N., Appl. Phys. Lett. 72(21), 2763 (1998).10.1063/1.121083
8. Ramesh, R., Dutta, B., Ravi, T. S., Lee, J., Sands, T., and Keramidas, V. G., Appl. Phys. Lett. 64(12), 1588 (1994).10.1063/1.111848
9. Kholkin, A., Colla, E., Brooks, K., Muralt, P., Kohli, M., Maeder, T., Taylor, D., and Setter, N., Microelectronic Engineering 29, 261 (1995).10.1016/0167-9317(95)00157-3
10. Hong, S., Shin, H., Jeon, J. U., Pak, E. Y., and No, K., submitted for publication (1999).

Characterization of Retention Phenomena of Micron-Size Electrical Domains in Pzt Thin Films

  • Seungbum Hong (a1), Hyunjung Shin (a2), Y. Eugene Pak (a2) and Kwangsoo No (a1)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed