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Characterization of OMVPE-Grown AlGaInN Heterostructures

Published online by Cambridge University Press:  10 February 2011

D. P. Bour ,
H. F. Chung ,
W. Götz ,
L. Romano ,
B. S. Krusor ,
D. Hofstetter ,
S. Rudaz ,
C. P. Kuo ,
F. A. Ponce  and
N. M. Johnson
...Show all authors
D. P. Bour
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
H. F. Chung
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
W. Götz
Affiliation:
Hewlett-Packard Optoelectronics Divison, 370 West Trimble Road, San Jose, CA 95131
L. Romano
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
B. S. Krusor
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
D. Hofstetter
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
S. Rudaz
Affiliation:
Hewlett-Packard Optoelectronics Divison, 370 West Trimble Road, San Jose, CA 95131
C. P. Kuo
Affiliation:
Hewlett-Packard Optoelectronics Divison, 370 West Trimble Road, San Jose, CA 95131
F. A. Ponce
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
N. M. Johnson
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
M. G. Craford
Affiliation:
Hewlett-Packard Optoelectronics Divison, 370 West Trimble Road, San Jose, CA 95131
R. D. Bringans
Affiliation:
XEROX Palo Alto Research Center, Electronic Materials Laboratory, 3333 Coyote Hill Road, Palo Alto, CA 94304, bour@parc.xerox.com
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Abstract

We report on the OMVPE growth and characterization of AlGalnN and its heterostructures, including measurements of electrical properties (Hall), optical properties (photo- and cathodo- luminescence), structural characteristics (x-ray diffraction and TEM); and also the emission of InGaN/AlGaN heterostructures subject to optical and electrical pumping.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 449: Symposium N – III-V Nitrides , 1996 , 509
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1. Akasaki, I. and Amano, H., Jour. Electrochemical Soc., 141, 2266 (1994).Google Scholar
2. Nakamura, S., Senoh, M., Iwasa, N., and Nagahama, S., Jpn. Jour. Applied Physics, 34, L797 (1995).Google Scholar
3. Nakamura, S., Mukai, T., and Senoh, M., Jour. Applied Physics, 76, 8189 (1994).Google Scholar
4. Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Kiyoku, H., and Sugimoto, Y., Jpn. Jour. Applied Physics, 35, L74 (1996).Google Scholar
5. Akasaki, I., Amano, H., Sota, S., Sakai, H., Tanaka, T., and Koike, M., Jpn. Jour. Applied Physics, 34, L1517 (1995).Google Scholar
6. Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Sugimoto, Y., and Kiyoku, H., Applied Physics Letters 69, 1477 (1996).Google Scholar
7. Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Sugimoto, Y., and Kiyoku, H., Applied Physics Letters 69, 1568 (1996).Google Scholar
8. Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Sugimoto, Y., and Kiyoku, H., to be published in Applied Physics Letters 69 (1996).Google Scholar
9. Götz, W., Johnson, N. M., Walker, J., Bour, D. P., and Street, R. A., Applied Physics Letts., 68, 667 (1996).Google Scholar
10. Rees, P., Cooper, C., Smowton, P. M., Blood, P., and Hegarty, J., IEEE Photonics Technology Letters, 8, 197 (1996).Google Scholar