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Characterization of New Materials in A Four-Sample Thermoelectric Measurement System

  • Nishant A. Ghelani (a1), Sim Y. Loo (a1), Duck-Young Chung (a2), Sandrine Sportouch (a2), Stephan de Nardi (a2), Mercouri G. Kanatzidis (a2), Timothy P. Hogan (a2) and George S. Nolas (a3)...

Abstract

Several new materials in the CsBi4Te6, A2Bi8Se13, (A = K, Rb, Cs), HoNiSb, Ba/Ge/B (B = In, Sn), and AgPbBiQ3 (Q = S, Se, Te) systems have shown promising characteristics for thermoelectric applications. New synthesis techniques are able to produce samples at much higher rates than previously possible. This has led to a persistent challenge in thermoelectric materials research of rapid and comprehensive characterization of samples. This paper presents a description of a new 4-sample transport measurement system and the related measurement techniques. Special features of the system include fully computer-controlled operation (implemented in LabView™) for simultaneous measurement of electrical conductivity, thermo-electric power, and thermal conductivity. This system has been successfully used to characterize several new thermoelectric materials (including some of the above-mentioned compounds) and reference materials exhibiting a wide range of thermal conductivities.

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References

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Characterization of New Materials in A Four-Sample Thermoelectric Measurement System

  • Nishant A. Ghelani (a1), Sim Y. Loo (a1), Duck-Young Chung (a2), Sandrine Sportouch (a2), Stephan de Nardi (a2), Mercouri G. Kanatzidis (a2), Timothy P. Hogan (a2) and George S. Nolas (a3)...

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