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Characterization of Glancing Angle Deposition Thin Film Optical Filters with Engineered Index Profiles

Published online by Cambridge University Press:  01 February 2011

James Gospodyn ,
Michael T. Taschuk ,
Peter C. P. Hrudey ,
Ying Y. Tsui ,
Robert Fedosejevs ,
Michael J. Brett  and
Jeremy C. Sit
James Gospodyn
Affiliation:
gospodyn@ee.ualberta.ca, University of Alberta, Electrical and Computer Engineering, 2nd Floor ECERF, Edmonton, Alberta, T6G 2V4, Canada, (780) 492-7926, (780) 492-2863
Michael T. Taschuk
Affiliation:
mtaschuk@ece.ualberta.ca, University of Alberta, Electrical and Computer Engineering, 2nd Floor ECERF, Edmonton, Alberta, T6G 2V4, Canada
Peter C. P. Hrudey
Affiliation:
phrudey@ualberta.ca, University of Alberta, Electrical and Computer Engineering, 2nd Floor ECERF, Edmonton, Alberta, T6G 2V4, Canada
Ying Y. Tsui
Affiliation:
tsui@ece.ualberta.ca, University of Alberta, Electrical and Computer Engineering, 2nd Floor ECERF, Edmonton, Alberta, T6G 2V4, Canada
Robert Fedosejevs
Affiliation:
rfed@ece.ualberta.ca, University of Alberta, Electrical and Computer Engineering, 2nd Floor ECERF, Edmonton, Alberta, T6G 2V4, Canada
Michael J. Brett
Affiliation:
brett@ece.ualberta.ca, University of Alberta, Electrical and Computer Engineering, 2nd Floor ECERF, Edmonton, Alberta, T6G 2V4, Canada
Jeremy C. Sit
Affiliation:
jsit@ece.ualberta.ca, University of Alberta, Electrical and Computer Engineering, 2nd Floor ECERF, Edmonton, Alberta, T6G 2V4, Canada
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Abstract

Periodic high-/low-index film stacks of Y2O3:Eu were grown with varying periodicities us-ing the glancing angle deposition (GLAD) technique onto silicon and fused silica substrates. Post-deposition annealing at temperatures from 600 to 1000°C for 1 hour in atmosphere was per-formed to enhance the photoluminescent output of the films. The films were optically character-ized using transmission measurements and Mueller matrix ellipsometry. The luminescence was measured using a spectrometer calibrated for absolute intensity measurements using a frequency-quadrupled Nd:YAG pulsed laser as an excitation source. Absolute conversion efficiencies were measured for the films by characterizing the angular emission profile. The angular emission pro-file of the films was found to follow a non-Lambertian emission profile, with peak emission in-tensities at 50° to 60° with respect to the substrate normal.

Keywords

luminescenceoptical propertiesphotoemission
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 928: Symposium GG – Current and Future Trends of Functional Oxide Films , 2006 , 0928-GG10-05
Copyright
Copyright © Materials Research Society 2006

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