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Characterization of Epitaxial Fe on GaAs(110) by Scanning Tunneling Microscopy

Published online by Cambridge University Press:  03 September 2012

R. A. Dragoset
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
P. N. First
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
Joseph A. Stroscio
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
D. T. Pierce
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
R. J. Celotta
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
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Abstract

Iron on GaAs(110) comprises an interesting system not only due to small lattice mismatch, 1.4%, but also because of the magnetic properties of the overlayer. In the present work, scanning tunneling microscopy (STM) was used to investigate bcc Fe films in the 0.1 Å to 20 Å thickness range, grown at 300 K and 450 K substrate temperatures. STM images show Volmer-Weber growth with the formation of 3-D Fe islands 20–30 Å in diameter for 0.1–1 Å deposition at 300 K, increasing to 40–50 Å for thicker films. Iron island sizes at low coverage and thin film roughness at higher coverages both show significant dependence upon growth temperature.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

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