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Characterisation of Ultrafine Microstructures Using a Position-Sensitive Atom Probe (POSAP)

  • Alfred Cerezo (a1), Chris R. M. Grovenor (a1), Mark G. Hetherington (a1), Barbara A. Shollock (a1) and George D. W. Smith (a1)...

Abstract

A new development in the experimental techniques of atom probe microanalysis is described, which involves the use of a position sensitive detector system. This detector subtends a large solid angle (∼20°) at the specimen, and therefore permits the collection of ions from a substantial fraction of the whole surface area of the emitter. Progressive pulsed field evaporation leads to the construction of a three-dimensional map of the atomic chemistry of the specimen. The new instrument is ideally suited to the investigation of complex, ultrafine microstructures. Applications to the study of age-hardened aluminium alloys and Alnico permanent magnet materials are described.

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[5] Cerezo, A., Godfrey, T.J., Grovenor, C.R.M., Hetherington, M.G., Hoyle, R.M., Jakubovics, J.P., Liddle, J.A., Smith, G.D.W. and Worrall, G.M., J. Microscopy, in press.
[6] Cerezo, A., Godfrey, T.J. and Smith, G.D.W., Proc. 35th International Field Emission Symposium, Oak Ridge, 1988, J. de Physique, in press.
[7] Liddle, J.A., Cerezo, A. and Grovenor, C.R.M., Proc. 35th International Field Emission Symposium, Oak Ridge, 1988, J. de Physique, in press.
[8] Liddle, J.A., Norman, A.G., Cerezo, A. and Grovenor, C.R.M., paper submitted to Appl. Phys. Lett. (November 1988).
[9] Polmear, I.J. and Couper, M.J., Metall. Trans. 19A, 1027 (1988).
[10] Hetherington, M.G., Cerezo, A., Jakubovics, J.P. and Smith, G.D.W., Proc. International Conference on Magnetism, Paris 1988, in press.

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