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Characterisation of the physico-chemical properties of surface-treated indium tin oxide anodes for organic light-emitting diodes

Published online by Cambridge University Press:  10 February 2011

J. S. Kima
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge, CB3 OHE, UK
M. Granströma
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge, CB3 OHE, UK
R. H. Friend
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge, CB3 OHE, UK
N. Johansson
Affiliation:
Department of Physics, IFM, University of Linköping, S-518 83 Linköping, Sweden
W. R. Salaneck
Affiliation:
Department of Physics, IFM, University of Linköping, S-518 83 Linköping, Sweden
A. Cola
Affiliation:
CCNR IME Istituto Nuovi Materiali per I'Elettronica, Via Arnesano, Lecce, Italy
G. Gigli
Affiliation:
INFM, Dep. of Material Science, Univ. of Lecce, Via Amesano, Lecce, Italy
R. Cingolani
Affiliation:
INFM, Dep. of Material Science, Univ. of Lecce, Via Amesano, Lecce, Italy
F. Cacialli
Affiliation:
Cavendish Laboratory, Madingley Road, Cambridge, CB3 OHE, UK
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Abstract

We studied the surface properties of indium-tin oxide (ITO) modified by wet (aquaregia, ultrasonication, RCA) and dry (oxygen- and argon-plasma) treatments. The surface modification was investigated by surface energy, surface morphology, sheet resistance, carrier concentration, carrier mobility, and workfunction measurements. We report that the studied oxygen-plasma treatment induces: the highest surface energy with the highest polarity, the smoothest surface, the highest carrier density but the lowest mobility, the lowest sheet resistance, and the highest workfunction (stable in air). Polymer light-emitting diodes fabricated with the oxygen plasma treated substrates give the best performance in terms of electroluminescence efficiency and device lifetime. This is attributed to a favorable surface modification of ITO anodes by oxygen-plasma.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

1. Karg, S., Scott, J. C., Salem, J. R., and Angelopoulos, M., Synth. Met. 80, 111117 (1996).Google Scholar
2. Berntsen, A., Croonen, Y., Cuijpers, R., Habets, B., Liedenbaum, C., Schoo, H., Visser, R. J., Vleggaar, J., and P. Weijer, v. d., The Proceedings of SPIE's 42nd Annual Meeting, San Diego 3148, 264271 (1997).Google Scholar
3. Carter, S. A., Angelopoulos, M., Karg, S., Brock, P. J., and Scott, J. C., Appl. Phys. Lett. 70, 20672069 (1997).Google Scholar
4. Carter, J. C., Grizzi, I., Heeks, S. K., Lacey, D. J., Latham, S. G., May, P. G., delospanos, O. R., Pichler, K., Towns, C. R., and Wittmann, H. F., Appl. Phys. Lett. 71, 3436 (1997).Google Scholar
5. Wu, C. C., Wu, C. I., Sturm, J. C., and Kahn, A., Appl. Phys. Lett. 70, 13481350 (1997).Google Scholar
6. Fujita, S., Sakamoto, T., Ueda, K., Ohta, K., and Fujita, S., Jap. J. Appl. Phys. Part 1 – Regular Papers Short Notes & Rev. Papers 36, 350353 (1997).Google Scholar
7. Li, F., Tang, H., Shinar, J., Resto, O., and Weisz, S. Z., Appl. Phys. Lett. 70, 27412743 (1997).Google Scholar
8. Chang, C. Y. and Sze, S. M., ULSI Technology (McGraw-Hill, Singapore, 1996), pp 6062.Google Scholar
9. Wu, S., Polymer Interface and Adhesion (Marcel Dekker Inc., New York, 1982), pp 171178.Google Scholar
10. Kim, J. S., Friend, R. H., and Cacialli, F., Appl. Phys. Lett., in press.Google Scholar
11. Kim, J. S., Cacialli, F., Cola, A., Gigli, G., and Cingolani, R., submitted to Appl. Phys. Lett. (1999).Google Scholar
12. Kim, J. S., Granstrdm, M., Friend, R. H., Johansson, N., Salaneck, W. R., Daik, R., Feast, W. J., and Cacialli, F., J. Appl. Phys. 84, 68596870 (1998).Google Scholar
13. Cox, P. A., The Electronic Structure and Chemistry of Solids (Oxford University Press, New York, 1987) pp 230232.Google Scholar
14. Ishida, T., Kobayashi, H., and Nakato, Y., J. Appl. Phys. 73, 43444350 (1993).Google Scholar
15. Kim, J. S., Ho, P. K. H., Friend, R. H., Bao, G. W., Li, S. F. Y., and Cacialli, F., unpublished.Google Scholar