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Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy

  • D. Andrew Evans (a1), Owain R. Roberts (a1), Gruffudd T. Williams (a1) and David. P. Langstaff (a1)

Abstract

An organic molecular beam deposition system coupled to a soft x-ray excitation source has been developed to monitor the growth of organic semiconductor thin films in-situ and in real-time. Rapid collection of photoelectron spectra has been enabled using a multichannel array detector coupled to a hemispherical analyzer. The organic semiconductor tin phthalocyanine (SnPc) exhibits a Stranski-Krastanov growth mode on a polycrystalline gold substrate where the transition thickness between layered and clustered growth has been determined to be comparable to the thickness of a single molecular layer within which the molecules are standing on edge relative to the substrate plane.

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1. Steudel, S., et al. ., Nat Mater 4, 597, (2005).
2. Li, N., et al. ., Appl Phys Lett 94, 023307, (2009).
3. Dediu, V.A., et al. ., Nat Mater 8, 707, (2009).
4. Langstaff, D.P., et al. ., Nucl Instrum Methods B 238, 219, (2005).
5. Evans, D.A., et al. ., J Phys: Condens Matter 21 364223, (2009).
6. Evans, D.A., et al. ., J Vac Sci Technol B 28, C5F5, (2010).

Keywords

Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy

  • D. Andrew Evans (a1), Owain R. Roberts (a1), Gruffudd T. Williams (a1) and David. P. Langstaff (a1)

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