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Carrier Mapping in Thermoelectric Materials

  • Georgios S. Polymeris (a1), Euripides Hatzikraniotis (a1), Eleni C. Stefanaki (a1), Eleni Pavlidou (a1), Theodora Kyratsi (a2), Konstantinos M. Paraskevopoulos (a1) and Mercouri G. Kanatzidis (a3)...


The application of micro-fourier transform infrared (FTIR) mapping analysis to thermoelectric materials towards identification of doping inhomogeneities is described. Micro-FTIR, in conjunction with fitting, is used as analytical tool for probing carrier content gradients. The plasmon frequency ω P 2 was studied as potential effective probe for carrier inhomogeneity and consequently doping differentiation based on its dependence of the carrier concentration. The method was applied to PbTe-, PbSe- and Mg2Si- based thermoelectric materials.



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