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Carrier Mapping in Thermoelectric Materials

  • Georgios S. Polymeris (a1), Euripides Hatzikraniotis (a1), Eleni C. Stefanaki (a1), Eleni Pavlidou (a1), Theodora Kyratsi (a2), Konstantinos M. Paraskevopoulos (a1) and Mercouri G. Kanatzidis (a3)...

Abstract

The application of micro-fourier transform infrared (FTIR) mapping analysis to thermoelectric materials towards identification of doping inhomogeneities is described. Micro-FTIR, in conjunction with fitting, is used as analytical tool for probing carrier content gradients. The plasmon frequency ω P 2 was studied as potential effective probe for carrier inhomogeneity and consequently doping differentiation based on its dependence of the carrier concentration. The method was applied to PbTe-, PbSe- and Mg2Si- based thermoelectric materials.

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