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Can we trust TEM images of silicate glasses?

Published online by Cambridge University Press:  01 February 2011

Nan Jiang
Nan Jiang*
Affiliation:
Department of Physics and Astronomy, Arizona State University Tempe, AZ 85287–1504, USA
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Abstract

Electron irradiation-induced modifications in two glasses, K2O – SiO2 and Au doped Na2O – B2O3 – SiO2, were observed in electron microscope. The products of modifications were “nano-particle” like contrasts in transmission electron microscopy (TEM) images, which can be easily confused with real nano-particles and phase separation. The driving force for the modifications in the glasses is the tendency of elimination of non-bridging oxygen (NBO) through the removal of cations. The phase separation into cation rich and poor region is their nature under electron irradiation. Therefore, it is absolutely essential to record in situ frames when the TEM images are used to provide microstructure information of glasses. Additionally, charging effects in glasses have also been discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 792: Symposium R – Radiation Effects and Ion Beam Processing of Materials , 2003 , R10.2
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Weber, W. J., Ewing, R. C., Angell, C. A., Arnold, G. W., Cormack, A. N., Delaye, J. M., Griscom, D. L., Hobbs, L. W., Navrotsky, A., Price, D. L., Stoneham, A. M., and Weinberg, M. C., J. Mater. Res. 12, 1946 (1997).Google Scholar
2. Kirkland, E., Ultramicroscopy 32, 349 (1990).Google Scholar
3. Jiang, N., Qiu, J., Gaeta, A. L., Silcox, J., Appl. Phys. Lett. 80, 2005 (2002).Google Scholar
4. Jiang, N., Qiu, J., and Silcox, J., Appl. Phys Lett. 77, 3956 (2000).Google Scholar
5. Jiang, N. and Silcox, J., J. Appl. Phys. 92, 2310 (2002).Google Scholar
6. Jiang, N., Qiu, J., Ellison, A., and Silcox, J., Phys. Rev. B 68, 064207 (2003).Google Scholar
7. Yun, Y. H. and Bray, P. J., J. Non-Cryst. Solids 27, 363 (1978).Google Scholar
8. Cazaux, J., Ultramicroscopy 60, 411 (1995).Google Scholar
9. Jiang, N. and Silcox, J., submitted to J. Non-Cryst. Solids (unpublished).Google Scholar