Hostname: page-component-7479d7b7d-68ccn Total loading time: 0 Render date: 2024-07-08T08:54:10.989Z Has data issue: false hasContentIssue false
  • English
  • Français

Basic Radiation Damage Processes in Ionic Solids: The Role of Collisional Electron Capture

Published online by Cambridge University Press:  25 February 2011

J. Fine ,
M. Szymonski ,
J. Kolodziej ,
M. Yoshitake  and
K. Franzreb
J. Fine
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
M. Szymonski
Affiliation:
Institute of Physics, Jagellonian University, 30-549 Krakow, Poland
J. Kolodziej
Affiliation:
Institute of Physics, Jagellonian University, 30-549 Krakow, Poland
M. Yoshitake
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA National Research Institute for Metals, Tsukuba, Ibaraki 305, Japan
K. Franzreb
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Get access

Abstract

A new class of inelastic collisional processes accounts for the electron spectra of ion-bombarded sodium halide surfaces. These spectra indicate that the deexcitation process consists of a sequence of lattice-ion collisions in which localized electron transfer occurs. Such collisional processes demonstrate how collisions can initiate electronic change in molecular compounds and that electron-transfer processes must play an essential role in chemistry activated by energetic collisions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 333: Symposium V – Scientific Basis for Nuclear Waste Management XVII , 1993 , 269
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Knotek, M.L. and Feibelman, P.J.: Phys. Rev. Lett. 40, 964 (1978).CrossRefGoogle Scholar
2 Kasi, S.R., Kang, H., Sass, C.S., and Rabalais, J.W.: Surf. Sci. Rep. 10, 1 (1989).CrossRefGoogle Scholar
3 Winters, H.F. and Coburn, J.W.: Surface Science Reports 14, 161 (1992).CrossRefGoogle Scholar
4 Snowden-Ifft, D., Price, P.B., Nagahara, L.A., and Fujishima, A.: Phys. Rev. Lett. 70, 2348 (1993).CrossRefGoogle Scholar
5 Weber, W.J., Mansur, L.K., Clinard, F.W. Jr., and Parkin, D.M.: J. Nucl. Mater. 184, 1 (1991).Google Scholar
6 Barat, M. and Lichten, W.: Phys. Rev. A6, 211 (1972).CrossRefGoogle Scholar
7 Wille, U. and Hippler, R.: Phys. Reports 132, 129 (1986).Google Scholar
8 Thomas, E.W.: Progr. Surf. Science 10, 383 (1980); S. Valeri: Surf. Science Reports 17, 85 (1993); J. Mischler and N. Benazeth: Scan. Electr. Microsc. II, 1986, 351 (1986).Google Scholar
9 Andreadis, T.D., Fine, J., and Matthew, J.A.D.: Nucl. Instr. Meth. 209/210, 495 (1983); M. H. Shapiro and J. Fine: Nucl. Instr. Meth. B44, 43 (1989); M. H. Shapiro, T. A. Tombrello, and J. Fine: Nucl. Instr. Meth. B74, 385 (1993).Google Scholar
10 Citrin, P.H., Rowe, J.E., and Christman, S.B.: Phys. Rev. B14, 2642 (1976); T. A. Green and D. R. Jennison: Phys. Rev. B36, 6112 (1987).CrossRefGoogle Scholar
11 Hennequin, J.-F. and Viaris de Lesegno, P.: Surf. Science 42, 50 (1974); I. Terzic, D. Ciric, and M. Matic: Phys. Letters A6l, 259 (1977).CrossRefGoogle Scholar
12 Fine, J., Szymonski, M., Kolodziej, J., Yoshitake, M., and Franzreb, K.: Nucl. Instr. Meth. B78, 129 (1993); J. Fine, M. Szymonski, J. Kolodziej, M. Yoshitake, and K. Franzreb: Phys. Rev. Lett. 71, 3585 (1993).CrossRefGoogle Scholar
13 Fine, , Szymonski, M., Kolodziej, J., Yoshitake, M., and Franzreb, K.: Phys. Rev. A (in press).Google Scholar
14 Ross, K.J., Ottley, T.W., Pejcev, V., and Rassi, D.: J. Phys. B9, 3237 (1976).Google Scholar
15 Breuckmann, E., Breuckmann, B., Mehlhorn, W., and Schmitz, W.: J. Phys. B10, 3135 (1977).Google Scholar
16 Dahl, P., Rødbro, M., Hermann, G., Fastrup, B., and Rudd, M.E.: J. Phys. B9, 1581 (1976).Google Scholar
17 Østgaard Olsen, J., Andersen, T., Barat, M., Courbin-Gaussorgues, C., Sidis, V., Pommier, J., Agusti, J., Andersen, N., and Russek, A.: Phys. Rev. A19, 1457 (1979).CrossRefGoogle Scholar
18 Hagstrum, H.D.: Phys. Rev. 96, 336 (1954); H. D. Hagstrum: in “Inelastic Ion-Surface Collisions”, edited by N. H. Tolk, J. C. Tully, W. Heiland, and C. W. White (Academic Press, New York, 1973), p. 1.CrossRefGoogle Scholar
19 Pegg, D.J., Haselton, H.H., Thoe, R.S., Griffin, P. M., Brown, M.D., and Sellin, I.A.: Phys. Rev. A12, 1330 (1975).Google Scholar
20 Citrin, P.H. and Thomas, T.D.: J. Chem. Phys. 57, 4446 (1972).Google Scholar
21 Landau, L.: Physik Z. Sowjetunion 2, 46 (1932); C. Zener: Proc. Roy. Soc. London A137, 696 (1932); E. C. G. Stueckelberg: Helv. Phys. Acta 5, 369 (1932).Google Scholar
22 Schippers, S., Hustedt, S., Heiland, W., Köhrbrück, R., Bleck-Neuhaus, J., Kemmler, J., Lecler, D., and Stolterfoht, N.: Phys. Rev. A46, 4003 (1992).CrossRefGoogle Scholar
23 Franzreb, K., Fine, J., Szymonski, M., Kolodziej, J., and Yoshitake, M.: (to be published).Google Scholar