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Automatic Orientation Mapping with Synchrotron Radiation
Published online by Cambridge University Press: 21 February 2011
Abstract
Synchrotron radiation can be utilized to obtain Laue back reflection patterns of microscopic areas with very short exposure time. A method is presented to fully automatically evaluate Laue patterns. The experimental setup and procedure are outlined to determine the orientations of a large number of contiguous grains, and consequently to enable orientation mapping. Preliminary experimental results are presented.
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- Copyright © Materials Research Society 1989