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Atom-Probe Microanalysis of Metallic Nanostructured Materials

  • Ross A.D. Mackenzie (a1), Alfred Cerezo (a1), James S. Conyers (a1), Amanda K. Petford-Long (a1), Sybren J. Subrandu (a1) and George D. W. Smith (a1)...

Abstract

Atom-probe techniques have been used to characterise nanostructured metallic materials prepared by thermal evaporation and by sputtering. Multilayer samples of Fe-Cr have been prepared by sputter deposition and analysed using the Oxford position-sensitive atom probe. This has made it possible to observe the quality of interfaces in the material, and also accurately determine local compositions at each layer within the multilayer stack. Preliminary experiments aimed at producing dual phase nanocrystalline films by thermal evaporator deposition are also reported.

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Atom-Probe Microanalysis of Metallic Nanostructured Materials

  • Ross A.D. Mackenzie (a1), Alfred Cerezo (a1), James S. Conyers (a1), Amanda K. Petford-Long (a1), Sybren J. Subrandu (a1) and George D. W. Smith (a1)...

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