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Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem

Published online by Cambridge University Press:  21 February 2011

M.M. Mcgibbon ,
N.D. Browning ,
M.F. Chisholm ,
S.J. Pennycook ,
V. Ravikumar  and
V.P. Dravid
M.M. Mcgibbon
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6031, USA
N.D. Browning
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6031, USA
M.F. Chisholm
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6031, USA
S.J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6031, USA
V. Ravikumar
Affiliation:
Northwestern University, Department of Materials Science and Engineering, Evanston, IL 60208, USA
V.P. Dravid
Affiliation:
Northwestern University, Department of Materials Science and Engineering, Evanston, IL 60208, USA
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Abstract

The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (EELS) at a spatial resolution approaching 0.22nm. In this paper we have combined the structural information available in the Z-contrast images with the bonding information obtained from the fine structure within the EELS edges to determine the grain boundary structure in a SrTiO3 bicrystal.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 319: Symposia CB – Defect-Interface Interactions , 1993 , 233
Copyright
Copyright © Materials Research Society 1994

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References

(1) Pennycook, S.J. and Jesson, D.E., Phys.Rev.Lett, 64, 938, (1990)Google Scholar
(2) Browning, N.D., Nature, 366, 143 (1993).CrossRefGoogle Scholar
(3) Crewe, A.V., Wall, J. and Langmore, J., Science, 168, 1338, (1970)Google Scholar
(4) Pennycook, S.J. and Jesson, D.E., Ultramicroscopy, 37, 14, (1991)CrossRefGoogle Scholar
(5) Pennycook, S.J., Annu. Rev. Mater. Sci., 22, 171, (1992)CrossRefGoogle Scholar
(6) McMullan, D., Institute of Physics Conference Series 98, 55, (1990)Google Scholar
(7) Browning, N.D. andPennycook, S.J., Microbeam Analysis, 2, 81, (1993)Google Scholar
(8) Pennycook, S.J., Contemp.Phys, 23, 371 (1982).CrossRefGoogle Scholar
(9) Batson, P.E., Ultramicroscopy, 47, 133 (1992).CrossRefGoogle Scholar
(10) Gull, S.F. andSkilling, J., IEEE Proc, 131F, 646 (1984)Google Scholar
(11) Grunes, L.A., Phys.Rev.B, 25, 7157 (1982).Google Scholar
(12) Brydson, R., Sauer, H. andEngel, W. in Transmission Electron Energy Loss Spectrometry in Materials Science, edited by Disko, M.,Ahn, C. and Fultz, B. (The Minerals, Metals and Materials Society, 1992) pp 131.Google Scholar
(13) DeCrescenzi, M., Phys.Rev.B, 39, 5520 (1989).Google Scholar
(14) Pearson, D.H., Ahn, C.C. andFultz, B., Phys.Rev.B, 47, 8471 (1993).Google Scholar
(15) Paterson, J.H. andKrivanek, O.L., Ultramicroscopy, 32, 319 (1990).Google Scholar
(16) Otten, M.T., Ultramicroscopy, 18, 285, (1985)Google Scholar
(17) Lin, X.W., Phys.Rev.B, 47, 3477 (1993).Google Scholar
(18) Brydson, R., J.Phys:Condens.Matter, 4, 3429 (1992).Google Scholar