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Atomic Force Microscopy of Growth Features on Epitaxial CdHgTe Films

  • M. Aindow (a1), T. T. Cheng (a1), I. P. Jones (a1), M. G. Astles (a2) and D. J. Williams (a1)...

Abstract

Atomic Force Microscopy has been used to observe the details of surface morphology on CdxHg1-xTe epitaxial films. On films grown by liquid phase epitaxy (LPE), tiered pyramidal features were observed and these are consistent with enhanced nucleation and growth at emergent edge dislocations which thread through from subgrain boundaries in the substrate. On films grown by metal-organic vapour phase epitaxy (MOVPE) using the interdiffused multilayer process (IMP), terraces and steps are observed as expected but the step edges are decorated. It is suggested that this corresponds to the deposition of one binary layer in Volmer-Weber mode.

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Bauser, E. and Strunk, H., J. Crystal Growth, 51, 367 (1981).
[2] Mutaftschiev, B., in Dislocations in Solids, edited by Nabarro, F.R.N., (North Holland, Amsterdam, 1980) p.57.
[3] Nouruzi-Khorasani, A., Jones, I.P., Dobson, P.S., Etem, Y., Williams, D.J., Astles, M.G., Ard, C. and Coates, G., J. Crystal Growth, 102, 819 (1990).

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