Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-25T13:33:47.168Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of Reactive Gas Plasma Cleaning Technology in Minimizing Contamination Of Specimens During Transmission and Analytical Electron Microscopy

Published online by Cambridge University Press:  10 February 2011

S. P. Roberts ,
N. J. Zaluzec ,
S. D. Walck  and
J. T. Grant
S. P. Roberts
Affiliation:
South Bay Technology, Inc., San Clemente, CA 92672
N. J. Zaluzec
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
J. T. Grant
Affiliation:
Research Institute, University of Dayton, 300 College Park, Dayton OH 45469-0167
Get access

Abstract

The generation and usage of a reactive gas plasma for a wide range of applications has been cited since the early 1970's. More recently, the use of a plasma generating system has been applied to analytical transmission electron microscopy to minimize and, in some cases, eliminate the problems associated with various contamination sources, including the specimen holder and the specimen itself. Although the technology is well known, no definitive characterization of process parameters has been developed for specimen and specimen holder cleaning applications. An investigation of the effects that power levels and gas mixtures have upon contamination rates and removal were done using a Philips CM30T. Measurements of contamination rates both prior to and following plasma cleaning were done to characterize the effects of various parameter changes. Results of different process parameters and contamination rates will be reported.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 480: Symposium Z – Specimen Preparation for Transmission Electron Microscopy…IV , 1997 , 127
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Brundle, C., Evans, C. Jr., Encyclopedia of Materials Characterization, Reed Publishing, (1992), Chptr. 3.0, 5.1.Google Scholar
2. Hren, J.J., Introduction to Analytical Electron Microscopy Plenum Press, (1979), Chptr. 18.Google Scholar
3. Simultaneous Specimen and Stage Cleaning Device for Analytical Electron Microscopy, US Patent # 5,510,624- Argonne National Laboratory and the University of Chicago.Google Scholar
4. Williams, D., Carter, C. Barry, Transmission Electron Microscopy: Spectrometry. Plenum Publishing, (1996), Chptr. 32.Google Scholar
5. Surface Science Aspects of Contamination in TEM Sample Preparation, Grant, John T., Walck, Scott D., Scheltens, Frank J., and Voevodin, Andrey A., these Proceedings of the Spring 1997 Materials Research Society Meeting, San Francisco, CA, 1997Google Scholar