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Applications of a Continuous Wave Incoherent Light Source (Cwils) to Semiconductor Processing

Published online by Cambridge University Press:  15 February 2011

H.B. Harrison
Affiliation:
J.M.R.C. Faculty of Engineering, Royal Melbourne Institute of Technology, Melbourne, 3000, Australia
S.T. Johnson
Affiliation:
J.M.R.C. Faculty of Engineering, Royal Melbourne Institute of Technology, Melbourne, 3000, Australia
B. Cornish
Affiliation:
J.M.R.C. Faculty of Engineering, Royal Melbourne Institute of Technology, Melbourne, 3000, Australia
F.M. Adams
Affiliation:
J.M.R.C. Faculty of Engineering, Royal Melbourne Institute of Technology, Melbourne, 3000, Australia
K.T. Short
Affiliation:
J.M.R.C. Faculty of Engineering, Royal Melbourne Institute of Technology, Melbourne, 3000, Australia
J.S. Williams
Affiliation:
J.M.R.C. Faculty of Engineering, Royal Melbourne Institute of Technology, Melbourne, 3000, Australia
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Abstract

We present results which highlight applications of a continuous wave incoherent light source in the processing of semiconductor devices. In particular, damage removal and activation of ion implanted gallium arsenide is demonstrated for both capless and capped annealing of low dose implants at temperatures of > 800°C for times < 10 s. For gallium arsenide FET applications, we demonstrate that it is possible to simultaneously carry out activation, contacting and interconnection steps by utilizing thermomigration processes which are not available with conventional furnace processing. In silicon we demonstrate that shallow multi layer bipolar structures can be successfully fabricated with anneal cycles that lead to supersaturation effects and negligible diffusion.

Type
Research Article
Copyright
Copyright © Materials Research Society 1983

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References

REFERENCES

1.Harrison, H. B., Grigg, M., Short, K. T., Williams, J. S. and Zylewicz, Z., in “Laser and Electron Beam Processing of Materials”, (Appleton, B. R. and Cellar, G.K., eds.). Elsevier-North Holland, New York (1982), p. 771.Google Scholar
2.Nishiyama, K., Arai, M., Watanabe, N., Jap. J. Appl. Physics, 19, 10 (1980).Google Scholar
3.Shah, N. J., Ahmed, H. and Leigh, P. A., Appl. Phys. Lett. 39, 322 (1981).Google Scholar
4.Davies, D. E., McNally, P. J., Lorenzo, J. P. and Julian, M., Electron. Device Lett. EDL3, 102 (1982).Google Scholar
5.Lietoila, A., Gold, R.B., Gibbons, J. F., J. Appl. Phys. 53, 2 (1982).Google Scholar
6.Cline, H. E., Anthony, T.R., J. Appl. Phys. 49, 4 (1978).Google Scholar
7.Parry, P. D., J. Vac. Sci. Tech. 13, No. 2, 1976.Google Scholar
8.Rose, A., Pollock, J. T. A., Scott, M. D., Adams, F. M., Williams, J. S., and Lawson, E. M., these proceedings.Google Scholar
9.Sealy, B. J., Microelectronics J. 13, 21 (1982).Google Scholar
10.Reeves, G. K., Harrison, H. B., IEEE Electron Device Letters, May 1982.Google Scholar
ll.Christou, A., Solid-State Electronics Vol. 23, 1979.Google Scholar
12.Benton, J. L., Cellar, G. K., Jacobson, D. C., Kimerling, L. C., Lischner, D. J., Miller, G. L. and Robinson, Mc. D., in “Laser and Electron Beam Interactions with Solids”, (Eds. Appleton, B. R. and Cellar, G. K.). (Elsevier-North Holland, New York, 1982) p. 765.Google Scholar
13.Trumbore, F., Bell Syst. Tech J. 39, 206 (1960).Google Scholar
14.Elliman, R. G., Harrison, H. B., Beanland, D. G., Nuclear Instruments and Methods 182/183 (1981).Google Scholar