Skip to main content Accessibility help
×
Home

Application of Scanning Tunneling Microscopy to the Study of Metals: Spectroscopy and Topography

  • R. C. Jaklevic (a1) and W. J. Kaiser (a1)

Abstract

The design and performance of a scanning tunneling microscope for use in the study of metal surfaces is described. The system was designed for ultra high vacuum together with standard sample cleaning and characterization techniques. The STM provides both topographic and spectroscopie information. Topographic images of well annealed Au(lll) show very smooth planes with single atomic steps. Corrugation on the (111) planes, which is expected from reconstruction models for this surface, is not seen. Other areas show monatomic steps in the form of an ordered array with a period corresponding to that derived from previous studies. A possible alternative reconstruction mechanism is suggested by these STM data. On the same surface are steeper sloped regions with multiple steps of equal height with wide facets. Spectroscopie first derivative data for Au and Pd show peaks which correspond to surface and bulk electronic states, for both filled and unfilled cases. The energy values of these states are compared directly with the results of other experimental methods. The use of combined topographic and spectroscopie mode for metals is anticipated.

Copyright

References

Hide All
1. Birmig, G. and Rohrer, H., Helvetica Physica Acta 55, 726 (1982); Surface Science 126, 236 (1983);IBM J. Res. and Dev. 30, 355 (1986).
2. Baratoff, A., Binnig, G., Fuchs, H., Salvan, F. and Stoli, E., Surface Science 168, 734 (1986).
3. Becker, R. S., Golovchenko, J. A., Hamann, D. R. and Swartzentruber, B. S., Phys. Rev. Lett. 55, 2032 (1985).
4. Feenstra, R. M., Thompson, W. A., and Fein, A. P., Phys. Rev. Lett. 56, 608 (1986).
5. Hamers, R. J., Tromp, R. M. and Demuth, J. E., Phys. Rev. Lett. 56, 1972 (1986).
6. Kaiser, W. J. and Jaklevic, R. C., IBM J. of Res. and Dev. 210, 411 (1986).
7. Kaiser, W. J. and Jaklevic, R. C., Proceedings of the First Int. Conference on Scanning Tunneling Microscopy (STM'86), Surface Science (to be published).
8. Binnig, G., Rohrer, H., Ch., Gerber and Stoll, E., Surface Science 144, 321 (1984).
9. Behm, R. J., Hosier, W., Ritter, E. and Binnig, G., Phys. Rev. Lett. 56, 228 (1986).
10. Zehner, D. M. and Wendelken, J. F., Proceedings of the Seventh Int. Vacuum Congress and the Third Int. Conference of Solid Surfaces, Vienna, 1977, edited by Dobrozemsky, R. et al. (F. Berger and Sohne, Vienna, 1977), p. 517.
11. Harten, U., Lahee, A. M., Peter Toennies, J. and Ch., Woll, Phys. Rev. Lett. 54, 2619 (1985) and refs. therein.
12. Jaklevic, R. C. and Lambe, J., Surf. Sci. 37, 922 (1973); Phys. Rev. B12, 4146 (1975).
13. Hussain, Z. and Smith, N. V., Physics Lett. 66A, 492 (1978).
14. Christensen, N. E. and Seraphin, B. O., Phys. Rev B4, 3321 (1971).
15. Christensen, N. E., Phys. Rev. B14, 3446 (1976);
Himpsel, F. J. and Eastman, D. E., Phys. Rev. B18, 5236 (1978).
16. Demuth, J. E., Surface Science. 65, 369 (1977).

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed