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Antiphase Domain Structures of CdTe on Sapphire Substrates

  • Kenji Maruyama (a1), Mitsuo Yoshikawa (a1) and Hiroshi Takigawa (a1)

Abstract

Antiphase domain (APD) structures have been discovered in CdTe layers grown on (0001) sapphire substrates by MOCVD. To explain APD formation, an obstruction model based on a surface-reaction mechanism has been proposed. The proportion of one-phase domains to the total area varies with the [DETe]/[DMCd] ratio (VI/II ratio). A single-domain CdTe layer can be obtained at a VI/II ratio of 5. The APD structure shows a strong correlation with the crystallinity measured by X-ray. For a single-domain CdTe epilayer, theFWHM of the X-ray rocking curve shows 114 arc seconds and the EPD is 6×10 cm−2

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Antiphase Domain Structures of CdTe on Sapphire Substrates

  • Kenji Maruyama (a1), Mitsuo Yoshikawa (a1) and Hiroshi Takigawa (a1)

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