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Analytical High-Resolution TEM Study on Au/TiO2 Catalysts

Published online by Cambridge University Press:  10 February 2011

T. Akita
Affiliation:
Osaka National Research Institute, AIST, Midorigaokal-8-31, Ikeda, Osaka, 563-8577, JAPAN, akita@onri.go.jp
K. Tanaka
Affiliation:
Osaka National Research Institute, AIST, Midorigaokal-8-31, Ikeda, Osaka, 563-8577, JAPAN, akita@onri.go.jp
S. Tsubota
Affiliation:
Osaka National Research Institute, AIST, Midorigaokal-8-31, Ikeda, Osaka, 563-8577, JAPAN, akita@onri.go.jp
M. Haruta
Affiliation:
Osaka National Research Institute, AIST, Midorigaokal-8-31, Ikeda, Osaka, 563-8577, JAPAN, akita@onri.go.jp
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Abstract

HRTEM(High-Resolution Transmission Electron Microscope), HAADF-STEM (High Angle Annular Dark Field Scanning Transmission Electron Microscope) and EELS(Electron Energy Loss Spectroscopy) techniques were applied for the characterization of Au/TiO2 catalysts. HAADFSTEM provides precise size distributions for Au particles smaller than ∼2nm in diameter. It was observed that many small particles under 2nm were supported on anatase TiO2 having a large surface area. The HAADF-STEM method was examined as a way to measure the shape of Au particles. EELS measurements were also used to examine the interface between Au and TiO2 support to study electronic structure effects.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

1.Haruta, M., Tsubota, S., Kobayashi, T., Kageyama, H., Genet, M. and Delmon, B., J.Catal. 144, 175(1993).Google Scholar
2.Hayashi, T., Tanaka, K. and Haruta, M., J.Catal. 178,566(1998).Google Scholar
3.Akita, T., Tanaka, K., Tsubota, S. and Haruta, M., J.Electro.Microsco.(1999)submittedGoogle Scholar
4.Ikuhara, Y. and Pirouz, P., Microscopy Research and Technique 40,317(1998)Google Scholar
5.Stemmer, S., Pirouz, P., Ikuhara, Y. and Davis, R.E, Phys. Rev. Lett. 77,1797(1996).Google Scholar
6.Ikuhara, Y. and Pirouz, P., Material Science Forum, 207–209,121(1996).Google Scholar
7.Tanaka, K., Hayashi, T. and Haruta, M., Interface Science and Material Interconection Proc. Of JIMIS-8, The Japan Institute of Metals, p.547(1996)Google Scholar
8.Treacy, M.M.J. and Howie, A., J.Catal. 63,265(1980).Google Scholar
9.Tsubota, S., Cunningham, D.A.H., Bando, Y. and Haruta, M., Preparation of catalysts VI. edited by Poncelet, G. et.al. (Elsevier, Amsterdam, 1995)p.227.Google Scholar
10.Treacy, M.M.J. and Rice, S.B., J. Microsco. 156,211(1989).Google Scholar
11.Singhal, A., Yang, J.C. and Gibson, J.M., Ultramicroscopy 67,191(1997).Google Scholar
12.Tsubota, S., Haruta, M., Kobayashi, T., Ueda, A. and Nakahara, Y., Preparation of catalysts V. edited by Poncelt, G., et al., (Elsevier, Amsterdam, 1991)p.695.Google Scholar
13.Leapman, R.D., Grunes, L.A. and Fejes, P.L., Phys.Rev.B 26,614(1982).Google Scholar