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Analysis of Zinc Compound Buffer Layers in Cu(In, Ga)(S, Se)2 Thin Film Solar Cells by Synchrotron-Based Soft X-Ray Spectroscopy

Published online by Cambridge University Press:  01 February 2011

I. Lauermann
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
M. Bär
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
A. Ennaoui
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
U. Fiedeler
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
Ch-H. Fischer
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
A. Grimm
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
I. Kötschau
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
M. Ch. Lux-Steiner
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
J. Reichardt
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
B. R. Sankapal
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
S. Siebentritt
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
S. Sokoll
Affiliation:
Hahn-Meitner-Institut, Berlin, Germany
L. Weinhardt
Affiliation:
Experimentelle Physik II, Universität Würzburg, Germany
O. Fuchs
Affiliation:
Experimentelle Physik II, Universität Würzburg, Germany
C. Heske
Affiliation:
Experimentelle Physik II, Universität Würzburg, Germany
C. Jung
Affiliation:
BESSY, Berlin, Germany
W. Gudat
Affiliation:
BESSY, Berlin, Germany
F. Karg
Affiliation:
Shell Solar GmbH, München, Germany
T.P. Niesen
Affiliation:
Shell Solar GmbH, München, Germany
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Abstract

Zinc-based buffer layers like ZnSe, ZnS, or wet-chemically deposited ZnO on Cu(In, Ga)(S, Se)2 absorber materials (CIGSSe) have yielded thin film solar cell efficiencies comparable to or even higher than standard CdS/CIGSSe cells. However, little is known about surface and interface properties of these novel buffer layers. In this contribution we characterize the specific chemical environment at the absorber/buffer-interface using X-ray Emission Spectroscopy (XES) and Photoelectron Spectroscopy (PES) in a complementary way. Evidence of intermixing and chemical reactions is found for different buffer materials and deposition methods.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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