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Analysis of Si-SiO2 Interfacial-Energy Hierarchy via Mixed-Phase Solidification of Si Films on SiO2

  • Ying Wang (a1), Monica D. Chahal (a1), J. J. Wang (a1), A. B. Limanov (a1), A. M. Chitu (a1) and James S. Im (a1)...

Abstract

We have experimentally investigated the anisotropy of Si-SiO2 interfacial energy by leveraging the mixed-phase solidification (MPS) method. By examining the microstructure evolution resulting from partial-melting-and-solidification cycles, and interpreting the changes in the surface-orientation distribution of the grains in terms of the thermodynamic model, we have identified the orientation-dependent hierarchical order of Si-SiO2 interfacial energies, σ{hkl}, as: σ{100} < σ{310} < σ{113} < σ{112} < σ{221} < σ{210}∼σ{331} < σ{111}, σ{110}.

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Keywords

Analysis of Si-SiO2 Interfacial-Energy Hierarchy via Mixed-Phase Solidification of Si Films on SiO2

  • Ying Wang (a1), Monica D. Chahal (a1), J. J. Wang (a1), A. B. Limanov (a1), A. M. Chitu (a1) and James S. Im (a1)...

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