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Analysis of Residual Stress Gradients Below the Surface of a Material Using a Multi-Energy Method

Published online by Cambridge University Press:  21 March 2011

Yanan Xiao ,
Tim Graber ,
Myungae Lee ,
Dale E. Wittmer  and
Susan M. Mini
Yanan Xiao
Affiliation:
Southern Illinois Univ, Dept of Mechanical Engineering and Energy Processes, Carbondale, IL The Center for Advanced Radiation Sources, The University of Chicago, Argonne, IL
Tim Graber
Affiliation:
The Center for Advanced Radiation Sources, The University of Chicago, Argonne, IL
Myungae Lee
Affiliation:
Southern Illinois Univ, Dept of Mechanical Engineering and Energy Processes, Carbondale, IL
Dale E. Wittmer
Affiliation:
Southern Illinois Univ, Dept of Mechanical Engineering and Energy Processes, Carbondale, IL
Susan M. Mini
Affiliation:
Northern Illinois Univ, Dept of Physics, De Kalb, IL and Materials Science Division, Argonne National Laboratory, Argonne, IL
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Abstract

The residual-stress-gradient distribution just below the surface of a material is an important factor to consider during the engineering and design of a component. With the availability of an intense energy-tunable synchrotron x-ray source, it becomes easier to analyze the stress gradient below the surface, using a multi-energy x-ray diffraction method. A program was developed to efficiently determine possible experimental parameters using a sample with a known stress gradient distribution. In addition, this program can also calculate the stress gradient distribution below the surface taking into account experimental results. It also includes a subroutine for calculating the x-ray absorption coefficients of all of the elements, generalizing it for use with any material. As an example, in the present study, the relationship between x-ray energy and the residual stress gradient is discussed according to the calculated result for a silicon nitride composition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 678: Symposia EE – Applications of Synchrotron Radiation Techniques…IV , 2001 , EE6.6.1
Copyright
Copyright © Materials Research Society 2001

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References

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