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Analysis of Residual Stress Gradients Below the Surface of a Material Using a Multi-Energy Method

  • Yanan Xiao (a1) (a2), Tim Graber (a2), Myungae Lee (a1), Dale E. Wittmer (a1) and Susan M. Mini (a3)...

Abstract

The residual-stress-gradient distribution just below the surface of a material is an important factor to consider during the engineering and design of a component. With the availability of an intense energy-tunable synchrotron x-ray source, it becomes easier to analyze the stress gradient below the surface, using a multi-energy x-ray diffraction method. A program was developed to efficiently determine possible experimental parameters using a sample with a known stress gradient distribution. In addition, this program can also calculate the stress gradient distribution below the surface taking into account experimental results. It also includes a subroutine for calculating the x-ray absorption coefficients of all of the elements, generalizing it for use with any material. As an example, in the present study, the relationship between x-ray energy and the residual stress gradient is discussed according to the calculated result for a silicon nitride composition.

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References

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1. Hauk, Viktor, Structural and Residual Stress Analysis by Nondestructive Methods (Elsevier Science B.V.), 1997, p.352395.
2. Eigenmann, B., Scholtes, B., Macherauch, E., In: Residual Stresses-III, Science and Technology, ICRS3, eds.: Fujiwara, H., Abe, T., Tanaka, K.. (Elsevier Applied Science, London and New York, Vol.1,1992, p.601606.
3. Sahiner, A., Wittmer, D.E., and Sweeny, M., Nucl. Instrum. Meth. B 133, 7376(1997)
4. Xiao, Y., Inter. Conf. on Microprobe, 1994, Shanghai, China.

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