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An in Situ High Voltage Electron Microscopy Technique for the Study of Deformation and Fracture: in Multilayered Materials

Published online by Cambridge University Press:  15 February 2011

M.A. Wall ,
T.W. Barbee Jr.  and
T.P. Weihs
M.A. Wall
Affiliation:
Chemistry and Materials Science Department, L-350, Lawrence Livermore National Laboratory Livermore, CA. 94550.
T.W. Barbee Jr.
Affiliation:
Chemistry and Materials Science Department, L-350, Lawrence Livermore National Laboratory Livermore, CA. 94550.
T.P. Weihs
Affiliation:
Chemistry and Materials Science Department, L-350, Lawrence Livermore National Laboratory Livermore, CA. 94550.
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Abstract

A novel, in situ, high voltage electron microcopy technique for the direct observation of the micromechanisms of tensile deformation and fracture in nanostructured materials is detailed. This technique is particularly well suited for the dynamic observations of deformation and fracture in multilayered materials. The success of this type of in situ technique is highly dependent upon unique specimen preparation procedures and sample design, the importance thereof will be discussed. The initial observations discussed here are expected to aid in our understanding of the mechanical behavior of this new class of atomically engineered materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 382: Symposium G – Structure and Properties of Multilayered Thin Films , 1995 , 321
Copyright
Copyright © Materials Research Society 1995

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References

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